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Update test status for Atmel AT29C020 and SST29EE010

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Thanks to Urja Rannikko for reporting test results with these flash chips.

Corresponding to flashrom svn r263 and coreboot v2 svn r3374.

Signed-off-by: Peter Stuge <peter@stuge.se>
Acked-by: Peter Stuge <peter@stuge.se>
This commit is contained in:
Peter Stuge 2008-06-21 00:21:22 +00:00
parent 6a9fd1dc8c
commit 0a0a795131
1 changed files with 2 additions and 2 deletions
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4
flashchips.c
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@ -39,7 +39,7 @@ struct flashchip flashchips[] = {
{"AMD", "Am29F040B", AMD_ID, AM_29F040B, 512, 64 * 1024, TEST_OK_PREW, probe_29f040b, erase_29f040b, write_29f040b}, {"AMD", "Am29F040B", AMD_ID, AM_29F040B, 512, 64 * 1024, TEST_OK_PREW, probe_29f040b, erase_29f040b, write_29f040b},
{"AMD", "Am29LV040B", AMD_ID, AM_29LV040B, 512, 64 * 1024, TEST_UNTESTED, probe_29f040b, erase_29f040b, write_29f040b}, {"AMD", "Am29LV040B", AMD_ID, AM_29LV040B, 512, 64 * 1024, TEST_UNTESTED, probe_29f040b, erase_29f040b, write_29f040b},
{"ASD", "AE49F2008", ASD_ID, ASD_AE49F2008, 256, 128, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec}, {"ASD", "AE49F2008", ASD_ID, ASD_AE49F2008, 256, 128, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec},
{"Atmel", "AT29C020", ATMEL_ID, AT_29C020, 256, 256, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec}, {"Atmel", "AT29C020", ATMEL_ID, AT_29C020, 256, 256, TEST_OK_PREW, probe_jedec, erase_chip_jedec, write_jedec},
{"Atmel", "AT29C040A", ATMEL_ID, AT_29C040A, 512, 256, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec}, {"Atmel", "AT29C040A", ATMEL_ID, AT_29C040A, 512, 256, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec},
{"Atmel", "AT49F002(N)", ATMEL_ID, AT_49F002N, 256, 256, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec}, {"Atmel", "AT49F002(N)", ATMEL_ID, AT_49F002N, 256, 256, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec},
{"Atmel", "AT49F002(N)T", ATMEL_ID, AT_49F002NT, 256, 256, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec}, {"Atmel", "AT49F002(N)T", ATMEL_ID, AT_49F002NT, 256, 256, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec},
@ -74,7 +74,7 @@ struct flashchip flashchips[] = {
{"SST", "SST25VF016B", SST_ID, SST_25VF016B, 2048, 256, TEST_UNTESTED, probe_spi_rdid, spi_chip_erase_c7, spi_chip_write, spi_chip_read}, {"SST", "SST25VF016B", SST_ID, SST_25VF016B, 2048, 256, TEST_UNTESTED, probe_spi_rdid, spi_chip_erase_c7, spi_chip_write, spi_chip_read},
{"SST", "SST25VF040B", SST_ID, SST_25VF040B, 512, 256, TEST_UNTESTED, probe_spi_rdid, spi_chip_erase_c7, spi_chip_write, spi_chip_read}, {"SST", "SST25VF040B", SST_ID, SST_25VF040B, 512, 256, TEST_UNTESTED, probe_spi_rdid, spi_chip_erase_c7, spi_chip_write, spi_chip_read},
{"SST", "SST28SF040A", SST_ID, SST_28SF040, 512, 256, TEST_UNTESTED, probe_28sf040, erase_28sf040, write_28sf040}, {"SST", "SST28SF040A", SST_ID, SST_28SF040, 512, 256, TEST_UNTESTED, probe_28sf040, erase_28sf040, write_28sf040},
{"SST", "SST29EE010", SST_ID, SST_29EE010, 128, 128, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec}, {"SST", "SST29EE010", SST_ID, SST_29EE010, 128, 128, TEST_OK_PREW, probe_jedec, erase_chip_jedec, write_jedec},
{"SST", "SST29LE010", SST_ID, SST_29LE010, 128, 128, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec}, {"SST", "SST29LE010", SST_ID, SST_29LE010, 128, 128, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec},
{"SST", "SST29EE020A", SST_ID, SST_29EE020A, 256, 128, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec}, {"SST", "SST29EE020A", SST_ID, SST_29EE020A, 256, 128, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec},
{"SST", "SST29LE020", SST_ID, SST_29LE020, 256, 128, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec}, {"SST", "SST29LE020", SST_ID, SST_29LE020, 256, 128, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec},