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opaque_master: Mark Opaque chip as tested for WP

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Opaque masters, by design, populate the flashchip structure during
the execution of their probe function. Therefore any opaque master
operation displays a message to the user:
"This flash part has status UNTESTED for operations: WP".

However, for all the other operations (read, write, erase) opaque
masters always mark them as tested. Thus, align WP as marked tested
inline with other opaque chip operations.

BUG=b:258755442
TEST=the following does not display untested message:
1) flashrom -p dummy:size=8388608,emulate=VARIABLE_SIZE
2) flashrom -p internal (on Intel device)

Change-Id: I5ae4cb49eb0abc6ab26cfe2f3359e4e50dd4fd4f
Signed-off-by: Anastasia Klimchuk <aklm@chromium.org>
Reviewed-on: https://review.coreboot.org/c/flashrom/+/69842
Tested-by: build bot (Jenkins) <no-reply@coreboot.org>
Reviewed-by: Edward O'Callaghan <quasisec@chromium.org>
Reviewed-by: Sergii Dmytruk <sergii.dmytruk@3mdeb.com>
Reviewed-by: Felix Singer <felixsinger@posteo.net>
This commit is contained in:
Anastasia Klimchuk
2022-11-21 12:50:07 +11:00
parent 8528ea0845
commit f206183eb4
3 changed files with 4 additions and 4 deletions
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2
dummyflasher.c
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@ -145,7 +145,7 @@ static int probe_variable_size(struct flashctx *flash)
msg_cdbg("%s: set flash->total_size to %dK bytes.\n", __func__,
flash->chip->total_size);
flash->chip->tested = TEST_OK_PREW;
flash->chip->tested = TEST_OK_PREWB;
if (emu_data->erase_to_zero)
flash->chip->feature_bits |= FEATURE_ERASED_ZERO;