mirror of
https://review.coreboot.org/flashrom.git
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Kyösti Mälkki noticed that we unnecessarily read the flash chip twice when called with --verify. The first one is the mandatory read before everything (to be able to detect the seriousness of errors), but the second one is not necessary because we can just use the former for the comparison. This introduces a small output change: previously we printed ERASE or VERIFY depending on the callee. This special case has been dropped because it is unnecessary to print it (and wrong for the verification function to need to know why it is verifying exactly). If an erase fails we mention that fact explicitly already, similar for verify. Corresponding to flashrom svn r1619. Signed-off-by: Stefan Tauner <stefan.tauner@alumni.tuwien.ac.at> Acked-by: Stefan Tauner <stefan.tauner@alumni.tuwien.ac.at>
315 lines
11 KiB
C
315 lines
11 KiB
C
/*
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* This file is part of the flashrom project.
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*
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* Copyright (C) 2000 Silicon Integrated System Corporation
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* Copyright (C) 2000 Ronald G. Minnich <rminnich@gmail.com>
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* Copyright (C) 2005-2009 coresystems GmbH
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* Copyright (C) 2006-2009 Carl-Daniel Hailfinger
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*
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* This program is free software; you can redistribute it and/or modify
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* it under the terms of the GNU General Public License as published by
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* the Free Software Foundation; either version 2 of the License, or
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* (at your option) any later version.
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*
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* This program is distributed in the hope that it will be useful,
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* but WITHOUT ANY WARRANTY; without even the implied warranty of
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* MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
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* GNU General Public License for more details.
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*
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* You should have received a copy of the GNU General Public License
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* along with this program; if not, write to the Free Software
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* Foundation, Inc., 51 Franklin St, Fifth Floor, Boston, MA 02110-1301 USA
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*/
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#ifndef __FLASH_H__
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#define __FLASH_H__ 1
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#include <stdint.h>
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#include <stddef.h>
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#ifdef _WIN32
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#include <windows.h>
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#undef min
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#undef max
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#endif
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#define ERROR_PTR ((void*)-1)
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/* Error codes */
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#define ERROR_OOM -100
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#define TIMEOUT_ERROR -101
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typedef unsigned long chipaddr;
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int register_shutdown(int (*function) (void *data), void *data);
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void *programmer_map_flash_region(const char *descr, unsigned long phys_addr,
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size_t len);
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void programmer_unmap_flash_region(void *virt_addr, size_t len);
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void programmer_delay(int usecs);
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#define ARRAY_SIZE(a) (sizeof(a) / sizeof((a)[0]))
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enum chipbustype {
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BUS_NONE = 0,
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BUS_PARALLEL = 1 << 0,
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BUS_LPC = 1 << 1,
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BUS_FWH = 1 << 2,
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BUS_SPI = 1 << 3,
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BUS_PROG = 1 << 4,
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BUS_NONSPI = BUS_PARALLEL | BUS_LPC | BUS_FWH,
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};
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/*
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* The following write granularities are known:
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* - 1 bit: Each bit can be cleared individually.
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* - 1 byte: A byte can be written once. Further writes to an already written byte cause its contents to be
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* either undefined or to stay unchanged.
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* - 128 bytes: If less than 128 bytes are written, the rest will be erased. Each write to a 128-byte region
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* will trigger an automatic erase before anything is written. Very uncommon behaviour.
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* - 256 bytes: If less than 256 bytes are written, the contents of the unwritten bytes are undefined.
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*/
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enum write_granularity {
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write_gran_1bit,
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write_gran_1byte,
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write_gran_256bytes,
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};
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/*
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* How many different contiguous runs of erase blocks with one size each do
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* we have for a given erase function?
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*/
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#define NUM_ERASEREGIONS 5
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/*
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* How many different erase functions do we have per chip?
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* Atmel AT25FS010 has 6 different functions.
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*/
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#define NUM_ERASEFUNCTIONS 6
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#define FEATURE_REGISTERMAP (1 << 0)
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#define FEATURE_BYTEWRITES (1 << 1)
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#define FEATURE_LONG_RESET (0 << 4)
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#define FEATURE_SHORT_RESET (1 << 4)
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#define FEATURE_EITHER_RESET FEATURE_LONG_RESET
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#define FEATURE_RESET_MASK (FEATURE_LONG_RESET | FEATURE_SHORT_RESET)
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#define FEATURE_ADDR_FULL (0 << 2)
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#define FEATURE_ADDR_MASK (3 << 2)
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#define FEATURE_ADDR_2AA (1 << 2)
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#define FEATURE_ADDR_AAA (2 << 2)
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#define FEATURE_ADDR_SHIFTED (1 << 5)
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#define FEATURE_WRSR_EWSR (1 << 6)
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#define FEATURE_WRSR_WREN (1 << 7)
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#define FEATURE_OTP (1 << 8)
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#define FEATURE_WRSR_EITHER (FEATURE_WRSR_EWSR | FEATURE_WRSR_WREN)
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struct flashctx;
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typedef int (erasefunc_t)(struct flashctx *flash, unsigned int addr, unsigned int blocklen);
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struct flashchip {
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const char *vendor;
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const char *name;
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enum chipbustype bustype;
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/*
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* With 32bit manufacture_id and model_id we can cover IDs up to
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* (including) the 4th bank of JEDEC JEP106W Standard Manufacturer's
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* Identification code.
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*/
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uint32_t manufacture_id;
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uint32_t model_id;
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/* Total chip size in kilobytes */
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unsigned int total_size;
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/* Chip page size in bytes */
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unsigned int page_size;
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int feature_bits;
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/*
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* Indicate if flashrom has been tested with this flash chip and if
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* everything worked correctly.
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*/
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uint32_t tested;
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int (*probe) (struct flashctx *flash);
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/* Delay after "enter/exit ID mode" commands in microseconds.
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* NB: negative values have special meanings, see TIMING_* below.
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*/
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signed int probe_timing;
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/*
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* Erase blocks and associated erase function. Any chip erase function
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* is stored as chip-sized virtual block together with said function.
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* The first one that fits will be chosen. There is currently no way to
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* influence that behaviour. For testing just comment out the other
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* elements or set the function pointer to NULL.
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*/
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struct block_eraser {
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struct eraseblock{
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unsigned int size; /* Eraseblock size in bytes */
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unsigned int count; /* Number of contiguous blocks with that size */
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} eraseblocks[NUM_ERASEREGIONS];
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/* a block_erase function should try to erase one block of size
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* 'blocklen' at address 'blockaddr' and return 0 on success. */
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int (*block_erase) (struct flashctx *flash, unsigned int blockaddr, unsigned int blocklen);
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} block_erasers[NUM_ERASEFUNCTIONS];
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int (*printlock) (struct flashctx *flash);
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int (*unlock) (struct flashctx *flash);
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int (*write) (struct flashctx *flash, uint8_t *buf, unsigned int start, unsigned int len);
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int (*read) (struct flashctx *flash, uint8_t *buf, unsigned int start, unsigned int len);
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struct voltage {
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uint16_t min;
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uint16_t max;
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} voltage;
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};
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struct flashctx {
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struct flashchip *chip;
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chipaddr virtual_memory;
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/* Some flash devices have an additional register space. */
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chipaddr virtual_registers;
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struct registered_programmer *pgm;
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};
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#define TEST_UNTESTED 0
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#define TEST_OK_PROBE (1 << 0)
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#define TEST_OK_READ (1 << 1)
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#define TEST_OK_ERASE (1 << 2)
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#define TEST_OK_WRITE (1 << 3)
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#define TEST_OK_PR (TEST_OK_PROBE | TEST_OK_READ)
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#define TEST_OK_PRE (TEST_OK_PROBE | TEST_OK_READ | TEST_OK_ERASE)
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#define TEST_OK_PRW (TEST_OK_PROBE | TEST_OK_READ | TEST_OK_WRITE)
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#define TEST_OK_PREW (TEST_OK_PROBE | TEST_OK_READ | TEST_OK_ERASE | TEST_OK_WRITE)
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#define TEST_OK_MASK 0x0f
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#define TEST_BAD_PROBE (1 << 4)
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#define TEST_BAD_READ (1 << 5)
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#define TEST_BAD_ERASE (1 << 6)
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#define TEST_BAD_WRITE (1 << 7)
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#define TEST_BAD_PREW (TEST_BAD_PROBE | TEST_BAD_READ | TEST_BAD_ERASE | TEST_BAD_WRITE)
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#define TEST_BAD_MASK 0xf0
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/* Timing used in probe routines. ZERO is -2 to differentiate between an unset
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* field and zero delay.
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*
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* SPI devices will always have zero delay and ignore this field.
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*/
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#define TIMING_FIXME -1
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/* this is intentionally same value as fixme */
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#define TIMING_IGNORED -1
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#define TIMING_ZERO -2
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extern const struct flashchip flashchips[];
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void chip_writeb(const struct flashctx *flash, uint8_t val, chipaddr addr);
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void chip_writew(const struct flashctx *flash, uint16_t val, chipaddr addr);
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void chip_writel(const struct flashctx *flash, uint32_t val, chipaddr addr);
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void chip_writen(const struct flashctx *flash, uint8_t *buf, chipaddr addr, size_t len);
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uint8_t chip_readb(const struct flashctx *flash, const chipaddr addr);
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uint16_t chip_readw(const struct flashctx *flash, const chipaddr addr);
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uint32_t chip_readl(const struct flashctx *flash, const chipaddr addr);
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void chip_readn(const struct flashctx *flash, uint8_t *buf, const chipaddr addr, size_t len);
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/* print.c */
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char *flashbuses_to_text(enum chipbustype bustype);
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int print_supported(void);
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void print_supported_wiki(void);
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/* flashrom.c */
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extern int verbose_screen;
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extern int verbose_logfile;
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extern const char flashrom_version[];
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extern char *chip_to_probe;
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void map_flash_registers(struct flashctx *flash);
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int read_memmapped(struct flashctx *flash, uint8_t *buf, unsigned int start, unsigned int len);
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int erase_flash(struct flashctx *flash);
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int probe_flash(struct registered_programmer *pgm, int startchip, struct flashctx *fill_flash, int force);
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int read_flash_to_file(struct flashctx *flash, const char *filename);
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int min(int a, int b);
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int max(int a, int b);
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void tolower_string(char *str);
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char *extract_param(char **haystack, const char *needle, const char *delim);
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int verify_range(struct flashctx *flash, uint8_t *cmpbuf, unsigned int start, unsigned int len);
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int need_erase(uint8_t *have, uint8_t *want, unsigned int len, enum write_granularity gran);
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char *strcat_realloc(char *dest, const char *src);
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void print_version(void);
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void print_buildinfo(void);
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void print_banner(void);
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void list_programmers_linebreak(int startcol, int cols, int paren);
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int selfcheck(void);
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int doit(struct flashctx *flash, int force, const char *filename, int read_it, int write_it, int erase_it, int verify_it);
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int read_buf_from_file(unsigned char *buf, unsigned long size, const char *filename);
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int write_buf_to_file(unsigned char *buf, unsigned long size, const char *filename);
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enum test_state {
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OK = 0,
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NT = 1, /* Not tested */
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BAD
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};
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/* Something happened that shouldn't happen, but we can go on. */
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#define ERROR_NONFATAL 0x100
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/* Something happened that shouldn't happen, we'll abort. */
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#define ERROR_FATAL -0xee
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#define ERROR_FLASHROM_BUG -200
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/* We reached one of the hardcoded limits of flashrom. This can be fixed by
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* increasing the limit of a compile-time allocation or by switching to dynamic
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* allocation.
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* Note: If this warning is triggered, check first for runaway registrations.
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*/
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#define ERROR_FLASHROM_LIMIT -201
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/* cli_output.c */
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#ifndef STANDALONE
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int open_logfile(const char * const filename);
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int close_logfile(void);
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void start_logging(void);
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#endif
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enum msglevel {
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MSG_ERROR = 0,
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MSG_INFO = 1,
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MSG_DEBUG = 2,
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MSG_DEBUG2 = 3,
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MSG_SPEW = 4,
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};
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/* Let gcc and clang check for correct printf-style format strings. */
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int print(enum msglevel level, const char *fmt, ...) __attribute__((format(printf, 2, 3)));
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#define msg_gerr(...) print(MSG_ERROR, __VA_ARGS__) /* general errors */
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#define msg_perr(...) print(MSG_ERROR, __VA_ARGS__) /* programmer errors */
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#define msg_cerr(...) print(MSG_ERROR, __VA_ARGS__) /* chip errors */
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#define msg_ginfo(...) print(MSG_INFO, __VA_ARGS__) /* general info */
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#define msg_pinfo(...) print(MSG_INFO, __VA_ARGS__) /* programmer info */
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#define msg_cinfo(...) print(MSG_INFO, __VA_ARGS__) /* chip info */
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#define msg_gdbg(...) print(MSG_DEBUG, __VA_ARGS__) /* general debug */
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#define msg_pdbg(...) print(MSG_DEBUG, __VA_ARGS__) /* programmer debug */
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#define msg_cdbg(...) print(MSG_DEBUG, __VA_ARGS__) /* chip debug */
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#define msg_gdbg2(...) print(MSG_DEBUG2, __VA_ARGS__) /* general debug2 */
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#define msg_pdbg2(...) print(MSG_DEBUG2, __VA_ARGS__) /* programmer debug2 */
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#define msg_cdbg2(...) print(MSG_DEBUG2, __VA_ARGS__) /* chip debug2 */
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#define msg_gspew(...) print(MSG_SPEW, __VA_ARGS__) /* general debug spew */
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#define msg_pspew(...) print(MSG_SPEW, __VA_ARGS__) /* programmer debug spew */
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#define msg_cspew(...) print(MSG_SPEW, __VA_ARGS__) /* chip debug spew */
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/* layout.c */
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int register_include_arg(char *name);
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int process_include_args(void);
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int read_romlayout(char *name);
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int handle_romentries(const struct flashctx *flash, uint8_t *oldcontents, uint8_t *newcontents);
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/* spi.c */
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struct spi_command {
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unsigned int writecnt;
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unsigned int readcnt;
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const unsigned char *writearr;
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unsigned char *readarr;
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};
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int spi_send_command(struct flashctx *flash, unsigned int writecnt, unsigned int readcnt, const unsigned char *writearr, unsigned char *readarr);
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int spi_send_multicommand(struct flashctx *flash, struct spi_command *cmds);
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uint32_t spi_get_valid_read_addr(struct flashctx *flash);
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enum chipbustype get_buses_supported(void);
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#endif /* !__FLASH_H__ */
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