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- Move all functions related to SPI status registers to a new file spi25_statusreg.c. This includes the generic as well as the SST-specific functions from spi25.c and the chip-specific functions from a25.c and at25.c. - introduce helper functions * spi_prettyprint_status_register_hex() * spi_prettyprint_status_register_bpl() * spi_prettyprint_status_register_plain() Use the latter on every compatible flash chip that has no better printlock function set and get rid of the implicit pretty printing in the SPI probing functions. - remove * spi_prettyprint_status_register_common() * spi_prettyprint_status_register_amic_a25lq032() because it can be fully substituted with spi_prettyprint_status_register_amic_a25l032(). * spi_prettyprint_status_register() (old switch, no longer needed) - promote and export * spi_prettyprint_status_register_amic_a25l05p() as spi_prettyprint_status_register_default_bp1(). * spi_prettyprint_status_register_amic_a25l40p() as spi_prettyprint_status_register_default_bp2(). * spi_prettyprint_status_register_st_m25p() as spi_prettyprint_status_register_default_bp3(). - add #define TEST_BAD_REW and use it for a number of Atmel chips which had only TEST_BAD_READ set even though they dont have erasers or a write function set. Corresponding to flashrom svn r1634. Signed-off-by: Stefan Tauner <stefan.tauner@alumni.tuwien.ac.at> Acked-by: Stefan Tauner <stefan.tauner@alumni.tuwien.ac.at>
316 lines
11 KiB
C
316 lines
11 KiB
C
/*
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* This file is part of the flashrom project.
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*
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* Copyright (C) 2000 Silicon Integrated System Corporation
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* Copyright (C) 2000 Ronald G. Minnich <rminnich@gmail.com>
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* Copyright (C) 2005-2009 coresystems GmbH
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* Copyright (C) 2006-2009 Carl-Daniel Hailfinger
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*
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* This program is free software; you can redistribute it and/or modify
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* it under the terms of the GNU General Public License as published by
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* the Free Software Foundation; either version 2 of the License, or
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* (at your option) any later version.
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*
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* This program is distributed in the hope that it will be useful,
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* but WITHOUT ANY WARRANTY; without even the implied warranty of
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* MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
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* GNU General Public License for more details.
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*
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* You should have received a copy of the GNU General Public License
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* along with this program; if not, write to the Free Software
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* Foundation, Inc., 51 Franklin St, Fifth Floor, Boston, MA 02110-1301 USA
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*/
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#ifndef __FLASH_H__
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#define __FLASH_H__ 1
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#include <stdint.h>
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#include <stddef.h>
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#ifdef _WIN32
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#include <windows.h>
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#undef min
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#undef max
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#endif
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#define ERROR_PTR ((void*)-1)
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/* Error codes */
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#define ERROR_OOM -100
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#define TIMEOUT_ERROR -101
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typedef unsigned long chipaddr;
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int register_shutdown(int (*function) (void *data), void *data);
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void *programmer_map_flash_region(const char *descr, unsigned long phys_addr,
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size_t len);
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void programmer_unmap_flash_region(void *virt_addr, size_t len);
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void programmer_delay(int usecs);
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#define ARRAY_SIZE(a) (sizeof(a) / sizeof((a)[0]))
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enum chipbustype {
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BUS_NONE = 0,
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BUS_PARALLEL = 1 << 0,
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BUS_LPC = 1 << 1,
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BUS_FWH = 1 << 2,
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BUS_SPI = 1 << 3,
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BUS_PROG = 1 << 4,
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BUS_NONSPI = BUS_PARALLEL | BUS_LPC | BUS_FWH,
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};
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/*
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* The following write granularities are known:
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* - 1 bit: Each bit can be cleared individually.
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* - 1 byte: A byte can be written once. Further writes to an already written byte cause its contents to be
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* either undefined or to stay unchanged.
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* - 128 bytes: If less than 128 bytes are written, the rest will be erased. Each write to a 128-byte region
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* will trigger an automatic erase before anything is written. Very uncommon behaviour.
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* - 256 bytes: If less than 256 bytes are written, the contents of the unwritten bytes are undefined.
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*/
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enum write_granularity {
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write_gran_1bit,
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write_gran_1byte,
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write_gran_256bytes,
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};
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/*
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* How many different contiguous runs of erase blocks with one size each do
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* we have for a given erase function?
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*/
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#define NUM_ERASEREGIONS 5
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/*
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* How many different erase functions do we have per chip?
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* Atmel AT25FS010 has 6 different functions.
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*/
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#define NUM_ERASEFUNCTIONS 6
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#define FEATURE_REGISTERMAP (1 << 0)
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#define FEATURE_BYTEWRITES (1 << 1)
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#define FEATURE_LONG_RESET (0 << 4)
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#define FEATURE_SHORT_RESET (1 << 4)
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#define FEATURE_EITHER_RESET FEATURE_LONG_RESET
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#define FEATURE_RESET_MASK (FEATURE_LONG_RESET | FEATURE_SHORT_RESET)
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#define FEATURE_ADDR_FULL (0 << 2)
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#define FEATURE_ADDR_MASK (3 << 2)
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#define FEATURE_ADDR_2AA (1 << 2)
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#define FEATURE_ADDR_AAA (2 << 2)
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#define FEATURE_ADDR_SHIFTED (1 << 5)
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#define FEATURE_WRSR_EWSR (1 << 6)
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#define FEATURE_WRSR_WREN (1 << 7)
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#define FEATURE_OTP (1 << 8)
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#define FEATURE_WRSR_EITHER (FEATURE_WRSR_EWSR | FEATURE_WRSR_WREN)
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struct flashctx;
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typedef int (erasefunc_t)(struct flashctx *flash, unsigned int addr, unsigned int blocklen);
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struct flashchip {
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const char *vendor;
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const char *name;
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enum chipbustype bustype;
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/*
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* With 32bit manufacture_id and model_id we can cover IDs up to
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* (including) the 4th bank of JEDEC JEP106W Standard Manufacturer's
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* Identification code.
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*/
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uint32_t manufacture_id;
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uint32_t model_id;
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/* Total chip size in kilobytes */
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unsigned int total_size;
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/* Chip page size in bytes */
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unsigned int page_size;
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int feature_bits;
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/*
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* Indicate if flashrom has been tested with this flash chip and if
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* everything worked correctly.
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*/
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uint32_t tested;
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int (*probe) (struct flashctx *flash);
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/* Delay after "enter/exit ID mode" commands in microseconds.
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* NB: negative values have special meanings, see TIMING_* below.
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*/
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signed int probe_timing;
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/*
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* Erase blocks and associated erase function. Any chip erase function
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* is stored as chip-sized virtual block together with said function.
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* The first one that fits will be chosen. There is currently no way to
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* influence that behaviour. For testing just comment out the other
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* elements or set the function pointer to NULL.
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*/
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struct block_eraser {
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struct eraseblock{
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unsigned int size; /* Eraseblock size in bytes */
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unsigned int count; /* Number of contiguous blocks with that size */
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} eraseblocks[NUM_ERASEREGIONS];
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/* a block_erase function should try to erase one block of size
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* 'blocklen' at address 'blockaddr' and return 0 on success. */
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int (*block_erase) (struct flashctx *flash, unsigned int blockaddr, unsigned int blocklen);
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} block_erasers[NUM_ERASEFUNCTIONS];
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int (*printlock) (struct flashctx *flash);
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int (*unlock) (struct flashctx *flash);
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int (*write) (struct flashctx *flash, uint8_t *buf, unsigned int start, unsigned int len);
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int (*read) (struct flashctx *flash, uint8_t *buf, unsigned int start, unsigned int len);
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struct voltage {
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uint16_t min;
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uint16_t max;
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} voltage;
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};
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struct flashctx {
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struct flashchip *chip;
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chipaddr virtual_memory;
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/* Some flash devices have an additional register space. */
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chipaddr virtual_registers;
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struct registered_programmer *pgm;
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};
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#define TEST_UNTESTED 0
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#define TEST_OK_PROBE (1 << 0)
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#define TEST_OK_READ (1 << 1)
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#define TEST_OK_ERASE (1 << 2)
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#define TEST_OK_WRITE (1 << 3)
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#define TEST_OK_PR (TEST_OK_PROBE | TEST_OK_READ)
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#define TEST_OK_PRE (TEST_OK_PROBE | TEST_OK_READ | TEST_OK_ERASE)
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#define TEST_OK_PRW (TEST_OK_PROBE | TEST_OK_READ | TEST_OK_WRITE)
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#define TEST_OK_PREW (TEST_OK_PROBE | TEST_OK_READ | TEST_OK_ERASE | TEST_OK_WRITE)
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#define TEST_OK_MASK 0x0f
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#define TEST_BAD_PROBE (1 << 4)
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#define TEST_BAD_READ (1 << 5)
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#define TEST_BAD_ERASE (1 << 6)
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#define TEST_BAD_WRITE (1 << 7)
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#define TEST_BAD_REW (TEST_BAD_READ | TEST_BAD_ERASE | TEST_BAD_WRITE)
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#define TEST_BAD_PREW (TEST_BAD_PROBE | TEST_BAD_READ | TEST_BAD_ERASE | TEST_BAD_WRITE)
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#define TEST_BAD_MASK 0xf0
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/* Timing used in probe routines. ZERO is -2 to differentiate between an unset
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* field and zero delay.
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*
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* SPI devices will always have zero delay and ignore this field.
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*/
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#define TIMING_FIXME -1
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/* this is intentionally same value as fixme */
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#define TIMING_IGNORED -1
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#define TIMING_ZERO -2
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extern const struct flashchip flashchips[];
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void chip_writeb(const struct flashctx *flash, uint8_t val, chipaddr addr);
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void chip_writew(const struct flashctx *flash, uint16_t val, chipaddr addr);
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void chip_writel(const struct flashctx *flash, uint32_t val, chipaddr addr);
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void chip_writen(const struct flashctx *flash, uint8_t *buf, chipaddr addr, size_t len);
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uint8_t chip_readb(const struct flashctx *flash, const chipaddr addr);
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uint16_t chip_readw(const struct flashctx *flash, const chipaddr addr);
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uint32_t chip_readl(const struct flashctx *flash, const chipaddr addr);
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void chip_readn(const struct flashctx *flash, uint8_t *buf, const chipaddr addr, size_t len);
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/* print.c */
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char *flashbuses_to_text(enum chipbustype bustype);
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int print_supported(void);
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void print_supported_wiki(void);
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/* flashrom.c */
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extern int verbose_screen;
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extern int verbose_logfile;
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extern const char flashrom_version[];
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extern char *chip_to_probe;
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void map_flash_registers(struct flashctx *flash);
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int read_memmapped(struct flashctx *flash, uint8_t *buf, unsigned int start, unsigned int len);
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int erase_flash(struct flashctx *flash);
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int probe_flash(struct registered_programmer *pgm, int startchip, struct flashctx *fill_flash, int force);
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int read_flash_to_file(struct flashctx *flash, const char *filename);
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int min(int a, int b);
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int max(int a, int b);
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void tolower_string(char *str);
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char *extract_param(char **haystack, const char *needle, const char *delim);
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int verify_range(struct flashctx *flash, uint8_t *cmpbuf, unsigned int start, unsigned int len);
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int need_erase(uint8_t *have, uint8_t *want, unsigned int len, enum write_granularity gran);
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char *strcat_realloc(char *dest, const char *src);
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void print_version(void);
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void print_buildinfo(void);
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void print_banner(void);
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void list_programmers_linebreak(int startcol, int cols, int paren);
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int selfcheck(void);
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int doit(struct flashctx *flash, int force, const char *filename, int read_it, int write_it, int erase_it, int verify_it);
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int read_buf_from_file(unsigned char *buf, unsigned long size, const char *filename);
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int write_buf_to_file(unsigned char *buf, unsigned long size, const char *filename);
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enum test_state {
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OK = 0,
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NT = 1, /* Not tested */
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BAD
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};
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/* Something happened that shouldn't happen, but we can go on. */
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#define ERROR_NONFATAL 0x100
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/* Something happened that shouldn't happen, we'll abort. */
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#define ERROR_FATAL -0xee
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#define ERROR_FLASHROM_BUG -200
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/* We reached one of the hardcoded limits of flashrom. This can be fixed by
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* increasing the limit of a compile-time allocation or by switching to dynamic
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* allocation.
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* Note: If this warning is triggered, check first for runaway registrations.
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*/
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#define ERROR_FLASHROM_LIMIT -201
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/* cli_output.c */
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#ifndef STANDALONE
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int open_logfile(const char * const filename);
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int close_logfile(void);
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void start_logging(void);
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#endif
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enum msglevel {
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MSG_ERROR = 0,
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MSG_INFO = 1,
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MSG_DEBUG = 2,
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MSG_DEBUG2 = 3,
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MSG_SPEW = 4,
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};
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/* Let gcc and clang check for correct printf-style format strings. */
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int print(enum msglevel level, const char *fmt, ...) __attribute__((format(printf, 2, 3)));
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#define msg_gerr(...) print(MSG_ERROR, __VA_ARGS__) /* general errors */
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#define msg_perr(...) print(MSG_ERROR, __VA_ARGS__) /* programmer errors */
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#define msg_cerr(...) print(MSG_ERROR, __VA_ARGS__) /* chip errors */
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#define msg_ginfo(...) print(MSG_INFO, __VA_ARGS__) /* general info */
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#define msg_pinfo(...) print(MSG_INFO, __VA_ARGS__) /* programmer info */
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#define msg_cinfo(...) print(MSG_INFO, __VA_ARGS__) /* chip info */
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#define msg_gdbg(...) print(MSG_DEBUG, __VA_ARGS__) /* general debug */
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#define msg_pdbg(...) print(MSG_DEBUG, __VA_ARGS__) /* programmer debug */
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#define msg_cdbg(...) print(MSG_DEBUG, __VA_ARGS__) /* chip debug */
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#define msg_gdbg2(...) print(MSG_DEBUG2, __VA_ARGS__) /* general debug2 */
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#define msg_pdbg2(...) print(MSG_DEBUG2, __VA_ARGS__) /* programmer debug2 */
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#define msg_cdbg2(...) print(MSG_DEBUG2, __VA_ARGS__) /* chip debug2 */
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#define msg_gspew(...) print(MSG_SPEW, __VA_ARGS__) /* general debug spew */
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#define msg_pspew(...) print(MSG_SPEW, __VA_ARGS__) /* programmer debug spew */
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#define msg_cspew(...) print(MSG_SPEW, __VA_ARGS__) /* chip debug spew */
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/* layout.c */
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int register_include_arg(char *name);
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int process_include_args(void);
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int read_romlayout(char *name);
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int handle_romentries(const struct flashctx *flash, uint8_t *oldcontents, uint8_t *newcontents);
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/* spi.c */
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struct spi_command {
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unsigned int writecnt;
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unsigned int readcnt;
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const unsigned char *writearr;
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unsigned char *readarr;
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};
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int spi_send_command(struct flashctx *flash, unsigned int writecnt, unsigned int readcnt, const unsigned char *writearr, unsigned char *readarr);
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int spi_send_multicommand(struct flashctx *flash, struct spi_command *cmds);
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uint32_t spi_get_valid_read_addr(struct flashctx *flash);
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enum chipbustype get_buses_supported(void);
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#endif /* !__FLASH_H__ */
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