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flashrom/tests/erase_func_algo.c
Peter Marheine 077c641c33 erasure_layout: Fix get_flash_region bug 
When flash regions are protected, erase could incorrectly erase regions
which were meant to be protected by requesting the correct size but
using an erase opcode with coarser granularity than desired (for
instance using a 16-byte erase command while attempting to erase only 8
bytes).

This fixes that by exchanging the nesting of the loops over erase blocks
and flash regions.

Old:
 - Select erasefns
 - Loop over blocks to erase for each selected erasefn
  - Loop over programmer flash regions within erase block
    - Erase regions (may fail since selected erasefn will be
      too big if flash region is smaller than erase block)

New:
 - Loop over programmer flash regions within erase block
   - Select erasefns within programer flash region
     - Loop over blocks to erase for each selected erasefn
     - Erase regions

Eraser selection and erasing has also been factored out into a helper
function to manage nesting depth.

TEST=New test cases pass, whereas some of them fail without the changes
     to erasure_layout.c
BUG=https://ticket.coreboot.org/issues/525

Change-Id: Ic5bf9d0f0e4a94c48d6f6e74e3cb9cccdc7adec9
Co-authored-by: Nikolai Artemiev <nartemiev@google.com>
Co-authored-by: Anastasia Klimchuk <aklm@flashrom.org>
Signed-off-by: Nikolai Artemiev <nartemiev@google.com>
Signed-off-by: Anastasia Klimchuk <aklm@flashrom.org>
Signed-off-by: Peter Marheine <pmarheine@chromium.org>
Reviewed-on: https://review.coreboot.org/c/flashrom/+/82393
Tested-by: build bot (Jenkins) <no-reply@coreboot.org>
Reviewed-by: Anastasia Klimchuk <aklm@chromium.org>
2024-06-11 06:30:02 +00:00

1395 lines
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/*
* This file is part of the flashrom project.
*
* This program is free software; you can redistribute it and/or modify
* it under the terms of the GNU General Public License as published by
* the Free Software Foundation; version 2 of the License.
*
* This program is distributed in the hope that it will be useful,
* but WITHOUT ANY WARRANTY; without even the implied warranty of
* MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
* GNU General Public License for more details.
*/
#include <include/test.h>
#include <stdio.h>
#include <string.h>
#include "tests.h"
#include "chipdrivers.h"
#include "flash.h"
#include "io_mock.h"
#include "libflashrom.h"
#include "programmer.h"
#define LOG_ERASE_FUNC printf("Eraser called with blockaddr=0x%x, blocklen=0x%x, erase_func=%d\n", blockaddr, blocklen, erase_func - TEST_ERASE_INJECTOR_1 + 1)
#define LOG_READ_WRITE_FUNC printf("%s called with start=0x%x, len=0x%x\n", __func__, start, len)
#define ERASE_VALUE 0xff
#define MOCK_CHIP_SIZE 16
#define MIN_BUF_SIZE 1024 /* Minimum buffer size flashrom operates for chip operations. */
#define MIN_REAL_CHIP_SIZE 1024 /* Minimum chip size that can be defined for real chip in flashchips */
struct test_region {
const size_t start;
const size_t end;
const char *name;
};
struct erase_invoke {
unsigned int blockaddr;
unsigned int blocklen;
enum block_erase_func erase_func;
};
struct test_case {
struct flashchip *chip; /* Chip definition. */
struct test_region regions[MOCK_CHIP_SIZE]; /* Layout regions. */
uint8_t initial_buf[MOCK_CHIP_SIZE]; /* Initial state of chip memory. */
uint8_t erased_buf[MOCK_CHIP_SIZE]; /* Expected content after erase. */
uint8_t written_buf[MOCK_CHIP_SIZE]; /* Expected content after write. */
uint8_t written_protected_buf[MOCK_CHIP_SIZE]; /* Expected content after write with protected region. */
struct erase_invoke eraseblocks_expected[MOCK_CHIP_SIZE]; /* Expected order of eraseblocks invocations. */
unsigned int eraseblocks_expected_ind; /* Expected number of eraseblocks invocations. */
char erase_test_name[40]; /* Test case display name for testing erase operation. */
char write_test_name[40]; /* Test case display name for testing write operation. */
};
struct all_state {
uint8_t buf[MIN_REAL_CHIP_SIZE]; /* Buffer emulating the memory of the mock chip. */
struct erase_invoke eraseblocks_actual[MOCK_CHIP_SIZE]; /* The actual order of eraseblocks invocations. */
unsigned int eraseblocks_actual_ind; /* Actual number of eraseblocks invocations. */
const struct test_case* current_test_case; /* Currently executed test case. */
} g_state;
static int read_chip(struct flashctx *flash, uint8_t *buf, unsigned int start, unsigned int len)
{
if (start + len <= MOCK_CHIP_SIZE)
LOG_READ_WRITE_FUNC;
assert_in_range(start + len, 0, MIN_REAL_CHIP_SIZE);
memcpy(buf, &g_state.buf[start], len);
return 0;
}
static int write_chip(struct flashctx *flash, const uint8_t *buf, unsigned int start, unsigned int len)
{
if (start + len <= MOCK_CHIP_SIZE)
LOG_READ_WRITE_FUNC;
assert_in_range(start + len, 0, MIN_REAL_CHIP_SIZE);
memcpy(&g_state.buf[start], buf, len);
return 0;
}
static int block_erase_chip_tagged(struct flashctx *flash, enum block_erase_func erase_func, unsigned int blockaddr, unsigned int blocklen)
{
if (blockaddr + blocklen <= MOCK_CHIP_SIZE) {
LOG_ERASE_FUNC;
/* Register eraseblock invocation. */
g_state.eraseblocks_actual[g_state.eraseblocks_actual_ind] = (struct erase_invoke){
.blocklen = blocklen,
.blockaddr = blockaddr,
.erase_func = erase_func,
};
g_state.eraseblocks_actual_ind++;
}
assert_in_range(blockaddr + blocklen, 0, MIN_REAL_CHIP_SIZE);
memset(&g_state.buf[blockaddr], ERASE_VALUE, blocklen);
return 0;
}
static struct flashchip chip_1_2_4_8_16 = {
.vendor = "aklm",
/*
* total_size is supposed to be in Kilobytes and this number is multiplied
* by 1024 everywhere in flashrom code. With this, we can't have the chip of
* size MOCK_CHIP_SIZE anyway, because MOCK_CHIP_SIZE is much smaller than
* 1024.
*
* So setting 1 here as this is the smallest possible value of unsigned int.
* Why aim for the smallest value? Because various places in flashrom code
* are allocating buffers of size total_size * 1024, however in these unit
* tests only MOCK_CHIP_SIZE bytes are tracked/logged/asserted.
*/
.total_size = 1,
.tested = TEST_OK_PREW,
.gran = WRITE_GRAN_1BYTE,
.read = TEST_READ_INJECTOR,
.write = TEST_WRITE_INJECTOR,
.block_erasers =
{
{
.eraseblocks = { {1, MIN_REAL_CHIP_SIZE} },
.block_erase = TEST_ERASE_INJECTOR_1,
}, {
.eraseblocks = { {2, MIN_REAL_CHIP_SIZE / 2} },
.block_erase = TEST_ERASE_INJECTOR_2,
}, {
.eraseblocks = { {4, MIN_REAL_CHIP_SIZE / 4} },
.block_erase = TEST_ERASE_INJECTOR_3,
}, {
.eraseblocks = { {8, MIN_REAL_CHIP_SIZE / 8} },
.block_erase = TEST_ERASE_INJECTOR_4,
}, {
.eraseblocks = { {16, MIN_REAL_CHIP_SIZE / 16} },
.block_erase = TEST_ERASE_INJECTOR_5,
}
},
};
static struct flashchip chip_1_8_16 = {
.vendor = "aklm",
/* See comment on previous chip. */
.total_size = 1,
.tested = TEST_OK_PREW,
.gran = WRITE_GRAN_1BYTE,
.read = TEST_READ_INJECTOR,
.write = TEST_WRITE_INJECTOR,
.block_erasers =
{
{
.eraseblocks = { {1, MIN_REAL_CHIP_SIZE} },
.block_erase = TEST_ERASE_INJECTOR_1,
}, {
.eraseblocks = { {8, MIN_REAL_CHIP_SIZE / 8} },
.block_erase = TEST_ERASE_INJECTOR_4,
}, {
.eraseblocks = { {16, MIN_REAL_CHIP_SIZE / 16} },
.block_erase = TEST_ERASE_INJECTOR_5,
}
},
};
static struct flashchip chip_8_16 = {
.vendor = "aklm",
/* See comment on previous chip. */
.total_size = 1,
.tested = TEST_OK_PREW,
.gran = WRITE_GRAN_1BYTE,
.read = TEST_READ_INJECTOR,
.write = TEST_WRITE_INJECTOR,
.block_erasers =
{
{
.eraseblocks = { {8, MIN_REAL_CHIP_SIZE / 8} },
.block_erase = TEST_ERASE_INJECTOR_4,
}, {
.eraseblocks = { {16, MIN_REAL_CHIP_SIZE / 16} },
.block_erase = TEST_ERASE_INJECTOR_5,
}
},
};
#define BLOCK_ERASE_FUNC(n) \
static int block_erase_chip_ ## n (struct flashctx *flash, unsigned int blockaddr, unsigned int blocklen) { \
return block_erase_chip_tagged(flash, TEST_ERASE_INJECTOR_ ## n, blockaddr, blocklen); \
}
BLOCK_ERASE_FUNC(1)
BLOCK_ERASE_FUNC(2)
BLOCK_ERASE_FUNC(3)
BLOCK_ERASE_FUNC(4)
BLOCK_ERASE_FUNC(5)
static void setup_chip(struct flashrom_flashctx *flashctx, struct flashrom_layout **layout,
const char *programmer_param, struct test_case *current_test_case)
{
g_test_write_injector = write_chip;
g_test_read_injector = read_chip;
/* Each erasefunc corresponds to an operation that erases a block of
* the chip with a particular size in bytes. */
memcpy(g_test_erase_injector,
(erasefunc_t *const[]){
block_erase_chip_1, // 1 byte
block_erase_chip_2, // 2 bytes
block_erase_chip_3, // 4 bytes
block_erase_chip_4, // 8 bytes
block_erase_chip_5, // 16 bytes
},
sizeof(g_test_erase_injector)
);
/* First MOCK_CHIP_SIZE bytes have a meaning and set with given values for this test case. */
memcpy(g_state.buf, current_test_case->initial_buf, MOCK_CHIP_SIZE);
/* The rest of mock chip memory does not matter. */
memset(g_state.buf + MOCK_CHIP_SIZE, ERASE_VALUE, MIN_REAL_CHIP_SIZE - MOCK_CHIP_SIZE);
/* Clear eraseblock invocation records. */
memset(g_state.eraseblocks_actual, 0, MOCK_CHIP_SIZE * sizeof(struct erase_invoke));
g_state.eraseblocks_actual_ind = 0;
flashctx->chip = current_test_case->chip;
printf("Creating layout ... ");
assert_int_equal(0, flashrom_layout_new(layout));
/* Adding regions from test case. */
int i = 0;
while (current_test_case->regions[i].name != NULL) {
assert_int_equal(0, flashrom_layout_add_region(*layout,
current_test_case->regions[i].start,
current_test_case->regions[i].end,
current_test_case->regions[i].name));
assert_int_equal(0, flashrom_layout_include_region(*layout, current_test_case->regions[i].name));
i++;
}
flashrom_layout_set(flashctx, *layout);
printf("done\n");
/*
* We need some programmer (any), and dummy is a very good one,
* because it doesn't need any mocking. So no extra complexity
* from a programmer side, and test can focus on working with the chip.
*/
printf("Dummyflasher initialising with param=\"%s\"... ", programmer_param);
assert_int_equal(0, programmer_init(&programmer_dummy, programmer_param));
/* Assignment below normally happens while probing, but this test is not probing. */
flashctx->mst = &registered_masters[0];
printf("done\n");
}
static void teardown_chip(struct flashrom_layout **layout)
{
printf("Dummyflasher shutdown... ");
assert_int_equal(0, programmer_shutdown());
printf("done\n");
printf("Releasing layout... ");
flashrom_layout_release(*layout);
printf("done\n");
}
/*
* Setup all test cases.
*
* First half of test cases is set up for a chip with erasers: 1, 2, 4, 8, 16 bytes.
* Second half repeates the same test cases for a chip with erasers: 1, 8, 16 bytes.
* Tests from #16 onwards use the chip with erasers: 8, 16 bytes, to test unaligned layout regions.
*/
static struct test_case test_cases[] = {
{
/*
* Test case #0
*
* Initial vs written: all 16 bytes are different.
* One layout region for the whole chip.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0x0, 0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7, 0x8,
0x9, 0xa, 0xb, 0xc, 0xd, 0xe, 0xf},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x10, 0x11, 0x12, 0x13, 0x14, 0x15, 0x16, 0x17, 0x18,
0x19, 0x1a, 0x1b, 0x1c, 0x1d, 0x1e, 0x1f},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.erase_test_name = "Erase test case #0",
.write_test_name = "Write test case #0",
}, {
/*
* Test case #1
*
* Initial vs written: 9 bytes the same, 7 bytes different.
* Two layout regions each one 8 bytes, which is 1/2 size of chip.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, MOCK_CHIP_SIZE/2 - 1, "part1"}, {MOCK_CHIP_SIZE/2, MIN_REAL_CHIP_SIZE - 1, "part2"}},
.initial_buf = {0xf0, 0xf1, 0xf2, 0xf3, 0xf4, 0xf5, 0xf6, 0xf7,
0xf8, 0xf9, 0xfa, 0xfb, 0xfc, 0xfd, 0xfe, 0xff},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xf0, 0xf1, 0xf2, 0xf3, 0xf4, 0xf5, 0xf6, 0xf7, 0xf8,
0x29, 0x2a, 0x2b, 0x2c, 0x2d, 0x2e, 0x2f},
.eraseblocks_expected = {{0x8, 0x8, TEST_ERASE_INJECTOR_4}, {0x0, 0x8, TEST_ERASE_INJECTOR_4}},
.eraseblocks_expected_ind = 2,
.erase_test_name = "Erase test case #1",
.write_test_name = "Write test case #1",
}, {
/*
* Test case #2
*
* Initial vs written: 6 bytes the same, 4 bytes different, 4 bytes the same, 2 bytes different.
* Two layout regions 11 and 5 bytes each.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, 10, "odd1"}, {11, 15, "odd2"}, {MOCK_CHIP_SIZE, MIN_REAL_CHIP_SIZE - 1, "longtail"}},
.initial_buf = {0xff, 0xff, 0x0, 0xff, 0x0, 0xff, 0x0, 0xff,
0x0, 0xff, 0x0, 0xff, 0xff, 0xff, 0xff, 0xff},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xff, 0xff, 0x0, 0xff, 0x0, 0xff, 0x20, 0x2f,
0x20, 0x2f, 0x0, 0xff, 0xff, 0xff, 0x2f, 0x2f},
.eraseblocks_expected = {
{0xb, 0x1, TEST_ERASE_INJECTOR_1},
{0xc, 0x4, TEST_ERASE_INJECTOR_3},
{0xa, 0x1, TEST_ERASE_INJECTOR_1},
{0x8, 0x2, TEST_ERASE_INJECTOR_2},
{0x0, 0x8, TEST_ERASE_INJECTOR_4}
},
.eraseblocks_expected_ind = 5,
.erase_test_name = "Erase test case #2",
.write_test_name = "Write test case #2",
}, {
/*
* Test case #3
*
* Initial vs written: 4 bytes the same, 4 bytes different, 8 bytes the same.
* One layout region covering the whole chip.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0xff, 0xff, 0xff, 0xff, 0x11, 0x22, 0x33, 0x44,
0xff, 0xff, 0xff, 0xff, 0xff, 0xff, 0xff, 0xff},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xff, 0xff, 0xff, 0xff, 0x1, 0x2, 0x3, 0x4,
0xff, 0xff, 0xff, 0xff, 0xff, 0xff, 0xff, 0xff},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.erase_test_name = "Erase test case #3",
.write_test_name = "Write test case #3",
}, {
/*
* Test case #4
*
* Initial vs written: 4 bytes different, 4 bytes the same, 8 bytes different.
* One layout region covering the whole chip.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0x1, 0x2, 0x3, 0x4, 0xff, 0xff, 0xff, 0xff,
0x11, 0x12, 0x13, 0x14, 0x15, 0x16, 0x17, 0x18},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x11, 0x22, 0x33, 0x44, 0xff, 0xff, 0xff, 0xff,
0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7, 0xa8},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.erase_test_name = "Erase test case #4",
.write_test_name = "Write test case #4",
}, {
/*
* Test case #5
*
* Initial vs written: 7 bytes different, 1 bytes the same, 8 bytes different.
* One layout region covering the whole chip.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7, 0xff,
0x11, 0x12, 0x13, 0x14, 0x15, 0x16, 0x17, 0x18},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x11, 0x22, 0x33, 0x44, 0x55, 0x66, 0x77, 0xff,
0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7, 0xa8},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.erase_test_name = "Erase test case #5",
.write_test_name = "Write test case #5",
}, {
/*
* Test case #6
*
* Initial vs written: 7 bytes the same, 1 bytes different, 8 bytes the same.
* One layout region covering the whole chip.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7, 0x1d,
0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7, 0xa8},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7, 0xdd,
0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7, 0xa8},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.erase_test_name = "Erase test case #6",
.write_test_name = "Write test case #6",
}, {
/*
* Test case #7
*
* Initial vs written: all 16 bytes are different.
* Layout with irregular regions unaligned with eraseblocks.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, 2, "reg3"}, {3, 7, "reg5"}, {8, 14, "reg7"}, {15, MIN_REAL_CHIP_SIZE - 1, "reg1"}},
.initial_buf = {0x0, 0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7,
0x8, 0x9, 0xa, 0xb, 0xc, 0xd, 0xe, 0xf},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x10, 0x11, 0x12, 0x13, 0x14, 0x15, 0x16, 0x17,
0x18, 0x19, 0x1a, 0x1b, 0x1c, 0x1d, 0x1e, 0x1f},
.eraseblocks_expected = {
{0xf, 0x1, TEST_ERASE_INJECTOR_1},
{0xe, 0x1, TEST_ERASE_INJECTOR_1},
{0xc, 0x2, TEST_ERASE_INJECTOR_2},
{0x8, 0x4, TEST_ERASE_INJECTOR_3},
{0x3, 0x1, TEST_ERASE_INJECTOR_1},
{0x4, 0x4, TEST_ERASE_INJECTOR_3},
{0x2, 0x1, TEST_ERASE_INJECTOR_1},
{0x0, 0x2, TEST_ERASE_INJECTOR_2}
},
.eraseblocks_expected_ind = 8,
.erase_test_name = "Erase test case #7",
.write_test_name = "Write test case #7",
}, {
/*
* Test case #8
*
* Initial vs written: all 16 bytes are different.
* One layout region for the whole chip.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0x0, 0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7,
0x8, 0x9, 0xa, 0xb, 0xc, 0xd, 0xe, 0xf},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x10, 0x11, 0x12, 0x13, 0x14, 0x15, 0x16, 0x17,
0x18, 0x19, 0x1a, 0x1b, 0x1c, 0x1d, 0x1e, 0x1f},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.erase_test_name = "Erase test case #8",
.write_test_name = "Write test case #8",
}, {
/*
* Test case #9
*
* Initial vs written: 9 bytes the same, 7 bytes different.
* Two layout regions each one 8 bytes, which is 1/2 size of chip.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, MOCK_CHIP_SIZE/2 - 1, "part1"}, {MOCK_CHIP_SIZE/2, MOCK_CHIP_SIZE - 1, "part2"},
{MOCK_CHIP_SIZE, MIN_REAL_CHIP_SIZE - 1, "longtail"}},
.initial_buf = {0xf0, 0xf1, 0xf2, 0xf3, 0xf4, 0xf5, 0xf6, 0xf7,
0xf8, 0xf9, 0xfa, 0xfb, 0xfc, 0xfd, 0xfe, 0xff},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xf0, 0xf1, 0xf2, 0xf3, 0xf4, 0xf5, 0xf6, 0xf7,
0xf8, 0x29, 0x2a, 0x2b, 0x2c, 0x2d, 0x2e, 0x2f},
.eraseblocks_expected = {{0x8, 0x8, TEST_ERASE_INJECTOR_4}, {0x0, 0x8, TEST_ERASE_INJECTOR_4}},
.eraseblocks_expected_ind = 2,
.erase_test_name = "Erase test case #9",
.write_test_name = "Write test case #9",
}, {
/*
* Test case #10
*
* Initial vs written: 6 bytes the same, 4 bytes different, 4 bytes the same, 2 bytes different.
* Two layout regions 11 and 5 bytes each.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, 10, "odd1"}, {11, 15, "odd2"}, {MOCK_CHIP_SIZE, MIN_REAL_CHIP_SIZE - 1, "longtail"}},
.initial_buf = {0xff, 0xff, 0x0, 0xff, 0x0, 0xff, 0x0, 0xff,
0x0, 0xff, 0x0, 0xff, 0xff, 0xff, 0xff, 0xff},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xff, 0xff, 0x0, 0xff, 0x0, 0xff, 0x20, 0x2f,
0x20, 0x2f, 0x0, 0xff, 0xff, 0xff, 0x2f, 0x2f},
.eraseblocks_expected = {
{0xb, 0x1, TEST_ERASE_INJECTOR_1},
{0xc, 0x1, TEST_ERASE_INJECTOR_1},
{0xd, 0x1, TEST_ERASE_INJECTOR_1},
{0xe, 0x1, TEST_ERASE_INJECTOR_1},
{0xf, 0x1, TEST_ERASE_INJECTOR_1},
{0x8, 0x1, TEST_ERASE_INJECTOR_1},
{0x9, 0x1, TEST_ERASE_INJECTOR_1},
{0xa, 0x1, TEST_ERASE_INJECTOR_1},
{0x0, 0x8, TEST_ERASE_INJECTOR_4}
},
.eraseblocks_expected_ind = 9,
.erase_test_name = "Erase test case #10",
.write_test_name = "Write test case #10",
}, {
/*
* Test case #11
*
* Initial vs written: 4 bytes the same, 4 bytes different, 8 bytes the same.
* One layout region covering the whole chip.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0xff, 0xff, 0xff, 0xff, 0x11, 0x22, 0x33, 0x44,
0xff, 0xff, 0xff, 0xff, 0xff, 0xff, 0xff, 0xff},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xff, 0xff, 0xff, 0xff, 0x1, 0x2, 0x3, 0x4,
0xff, 0xff, 0xff, 0xff, 0xff, 0xff, 0xff, 0xff},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.erase_test_name = "Erase test case #11",
.write_test_name = "Write test case #11",
}, {
/*
* Test case #12
*
* Initial vs written: 4 bytes different, 4 bytes the same, 8 bytes different.
* One layout region covering the whole chip.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0x1, 0x2, 0x3, 0x4, 0xff, 0xff, 0xff, 0xff,
0x11, 0x12, 0x13, 0x14, 0x15, 0x16, 0x17, 0x18},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x11, 0x22, 0x33, 0x44, 0xff, 0xff, 0xff, 0xff,
0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7, 0xa8},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.erase_test_name = "Erase test case #12",
.write_test_name = "Write test case #12",
}, {
/*
* Test case #13
*
* Initial vs written: 7 bytes different, 1 bytes the same, 8 bytes different.
* One layout region covering the whole chip.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7, 0xff,
0x11, 0x12, 0x13, 0x14, 0x15, 0x16, 0x17, 0x18},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x11, 0x22, 0x33, 0x44, 0x55, 0x66, 0x77, 0xff,
0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7, 0xa8},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.erase_test_name = "Erase test case #13",
.write_test_name = "Write test case #13",
}, {
/*
* Test case #14
*
* Initial vs written: 7 bytes the same, 1 bytes different, 8 bytes the same.
* One layout region covering the whole chip.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7, 0x1d,
0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7, 0xa8},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7, 0xdd,
0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7, 0xa8},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.erase_test_name = "Erase test case #14",
.write_test_name = "Write test case #14",
}, {
/*
* Test case #15
*
* Initial vs written: all 16 bytes are different.
* Layout with irregular regions unaligned with eraseblocks.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, 2, "reg3"}, {3, 7, "reg5"}, {8, 14, "reg7"},
{15, MIN_REAL_CHIP_SIZE - 1, "reg1"}},
.initial_buf = {0x0, 0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7,
0x8, 0x9, 0xa, 0xb, 0xc, 0xd, 0xe, 0xf},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x10, 0x11, 0x12, 0x13, 0x14, 0x15, 0x16, 0x17,
0x18, 0x19, 0x1a, 0x1b, 0x1c, 0x1d, 0x1e, 0x1f},
.eraseblocks_expected = {
{0xf, 0x1, TEST_ERASE_INJECTOR_1},
{0x8, 0x1, TEST_ERASE_INJECTOR_1},
{0x9, 0x1, TEST_ERASE_INJECTOR_1},
{0xa, 0x1, TEST_ERASE_INJECTOR_1},
{0xb, 0x1, TEST_ERASE_INJECTOR_1},
{0xc, 0x1, TEST_ERASE_INJECTOR_1},
{0xd, 0x1, TEST_ERASE_INJECTOR_1},
{0xe, 0x1, TEST_ERASE_INJECTOR_1},
{0x3, 0x1, TEST_ERASE_INJECTOR_1},
{0x4, 0x1, TEST_ERASE_INJECTOR_1},
{0x5, 0x1, TEST_ERASE_INJECTOR_1},
{0x6, 0x1, TEST_ERASE_INJECTOR_1},
{0x7, 0x1, TEST_ERASE_INJECTOR_1},
{0x0, 0x1, TEST_ERASE_INJECTOR_1},
{0x1, 0x1, TEST_ERASE_INJECTOR_1},
{0x2, 0x1, TEST_ERASE_INJECTOR_1},
},
.eraseblocks_expected_ind = 16,
.erase_test_name = "Erase test case #15",
.write_test_name = "Write test case #15",
}, {
/*
* Test case #16
*
* Initial vs written: all 16 bytes are different.
* Layout with unaligned regions 2+4+9+1b which are smaller than the smallest eraseblock.
* Chip with eraseblocks 8, 16.
*/
.chip = &chip_8_16,
.regions = {{0, 1, "reg2"}, {2, 5, "reg4"}, {6, 14, "reg9"},
{15, MIN_REAL_CHIP_SIZE - 1, "reg1"}},
.initial_buf = {0x4, 0x4, 0x5, 0x5, 0x5, 0x5, 0x6, 0x6,
0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x7},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x14, 0x14, 0x15, 0x15, 0x15, 0x15, 0x16, 0x16,
0x16, 0x16, 0x16, 0x16, 0x16, 0x16, 0x16, 0x17},
.eraseblocks_expected = {
{0x8, 0x8, TEST_ERASE_INJECTOR_4},
{0x0, 0x10, TEST_ERASE_INJECTOR_5},
{0x0, 0x8, TEST_ERASE_INJECTOR_4},
{0x0, 0x8, TEST_ERASE_INJECTOR_4},
},
.eraseblocks_expected_ind = 4,
.erase_test_name = "Erase test case #16",
.write_test_name = "Write test case #16",
}, {
/*
* Test case #17
*
* Initial vs written: all 16 bytes are different.
* Layout with unaligned region 3+13b which are smaller than the smallest eraseblock.
* Chip with eraseblocks 8, 16.
*/
.chip = &chip_8_16,
.regions = {{0, 2, "reg3"}, {3, MIN_REAL_CHIP_SIZE - 1, "tail"}},
.initial_buf = {0x4, 0x4, 0x4, 0x6, 0x6, 0x6, 0x6, 0x6,
0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x14, 0x14, 0x14, 0x16, 0x16, 0x16, 0x16, 0x16,
0x16, 0x16, 0x16, 0x16, 0x16, 0x16, 0x16, 0x16},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}, {0x0, 0x8, TEST_ERASE_INJECTOR_4}},
.eraseblocks_expected_ind = 2,
.erase_test_name = "Erase test case #17",
.write_test_name = "Write test case #17",
}, {
/*
* Test case #18
*
* Initial vs written: all 16 bytes are different.
* Layout with unaligned region 9+7b.
* Chip with eraseblocks 8, 16.
*/
.chip = &chip_8_16,
.regions = {{0, 8, "reg9"}, {9, MIN_REAL_CHIP_SIZE - 1, "tail"}},
.initial_buf = {0x4, 0x4, 0x4, 0x4, 0x4, 0x4, 0x4, 0x4,
0x4, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x14, 0x14, 0x14, 0x14, 0x14, 0x14, 0x14, 0x14,
0x14, 0x16, 0x16, 0x16, 0x16, 0x16, 0x16, 0x16},
.eraseblocks_expected = {{0x8, 0x8, TEST_ERASE_INJECTOR_4}, {0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 2,
.erase_test_name = "Erase test case #18",
.write_test_name = "Write test case #18",
}, {
/*
* Test case #19
*
* Initial vs written: 3 bytes of the logical layout are different, rest is the same.
* Layout with unaligned region 3 bytes. Layout does not cover the whole chip memory.
* Chip memory outside of logical layout is skipped by both erase and write ops.
* Chip with eraseblocks 8, 16.
*/
.chip = &chip_8_16,
.regions = {{0, 2, "reg3"}},
.initial_buf = {0x4, 0x4, 0x4, 0x0, 0x0, 0x0, 0x0, 0x0,
0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, 0x0,
0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0},
.written_buf = {0x14, 0x14, 0x14, 0x0, 0x0, 0x0, 0x0, 0x0,
0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0},
.eraseblocks_expected = {{0x0, 0x8, TEST_ERASE_INJECTOR_4}},
.eraseblocks_expected_ind = 1,
.erase_test_name = "Erase test case #19",
.write_test_name = "Write test case #19",
},
};
#define START_PROTECTED_REGION 6
#define END_PROTECTED_REGION 13
/*
* Setup all test cases with protected region.
* Protected region is the same for all test cases, between bytes 8 - 15.
*/
static struct test_case test_cases_protected_region[] = {
{
/*
* Test case #0
*
* Initial vs written: all 16 bytes are different.
* One layout region for the whole chip.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0x0, 0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7,
0x8, 0x9, 0xa, 0xb, 0xc, 0xd, 0xe, 0xf},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, 0x6, 0x7,
0x8, 0x9, 0xa, 0xb, 0xc, 0xd, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xf0, 0xf1, 0xf2, 0xf3, 0xf4, 0xf5, 0xf6, 0xf7,
0xf8, 0xf9, 0xfa, 0xfb, 0xfc, 0xfd, 0xfe, 0xff},
.written_protected_buf = {0xf0, 0xf1, 0xf2, 0xf3, 0xf4, 0xf5, 0x6, 0x7,
0x8, 0x9, 0xa, 0xb, 0xc, 0xd, 0xfe, 0xff},
.eraseblocks_expected = {{0x4, 0x2, TEST_ERASE_INJECTOR_2}, {0x0, 0x4, TEST_ERASE_INJECTOR_3},
{0xe, 0x2, TEST_ERASE_INJECTOR_2}},
.eraseblocks_expected_ind = 3,
.erase_test_name = "Erase protected region test case #0",
.write_test_name = "Write protected region test case #0",
}, {
/*
* Test case #1
*
* Initial vs written: all 16 bytes are different.
* Two layout regions each one 8 bytes, which is 1/2 size of chip.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, MOCK_CHIP_SIZE/2 - 1, "part1"}, {MOCK_CHIP_SIZE/2, MIN_REAL_CHIP_SIZE - 1, "part2"}},
.initial_buf = {0xf0, 0xf1, 0xf2, 0xf3, 0xf4, 0xf5, 0xf6, 0xf7,
0xf8, 0xf9, 0xfa, 0xfb, 0xfc, 0xfd, 0xfe, 0xff},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, 0xf6, 0xf7,
0xf8, 0xf9, 0xfa, 0xfb, 0xfc, 0xfd, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7,
0xa8, 0xa9, 0xaa, 0xab, 0xac, 0xad, 0xae, 0xaf},
.written_protected_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xf6, 0xf7,
0xf8, 0xf9, 0xfa, 0xfb, 0xfc, 0xfd, 0xae, 0xaf},
.eraseblocks_expected = {{0xe, 0x2, TEST_ERASE_INJECTOR_2}, {0x4, 0x2, TEST_ERASE_INJECTOR_2},
{0x0, 0x4, TEST_ERASE_INJECTOR_3}},
.eraseblocks_expected_ind = 3,
.erase_test_name = "Erase protected region test case #1",
.write_test_name = "Write protected region test case #1",
}, {
/*
* Test case #2
*
* Initial vs written: all 16 bytes are different.
* Three layout regions 8+4+4b
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, 7, "odd1"}, {8, 11, "odd2"}, {12, 15, "odd3"},
{MOCK_CHIP_SIZE, MIN_REAL_CHIP_SIZE - 1, "longtail"}},
.initial_buf = {0xff, 0xff, 0x0, 0xff, 0x0, 0xff, 0x0, 0xff,
0x0, 0xff, 0x0, 0xff, 0xff, 0xff, 0xff, 0xff},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, 0x0, 0xff,
0x0, 0xff, 0x0, 0xff, 0xff, 0xff, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7,
0xa8, 0xa9, 0xaa, 0xab, 0xac, 0xad, 0xae, 0xaf},
.written_protected_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0x0, 0xff,
0x0, 0xff, 0x0, 0xff, 0xff, 0xff, 0xae, 0xaf},
.eraseblocks_expected = {{0xe, 0x2, TEST_ERASE_INJECTOR_2}, {0x4, 0x2, TEST_ERASE_INJECTOR_2},
{0x0, 0x4, TEST_ERASE_INJECTOR_3}},
.eraseblocks_expected_ind = 3,
.erase_test_name = "Erase protected region test case #2",
.write_test_name = "Write protected region test case #2",
}, {
/*
* Test case #3
*
* Initial vs written: all 16 bytes are different.
* Layout with unaligned regions 2+4+9+1b which require use of the 1-byte erase block.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, 1, "reg2"}, {2, 5, "reg4"}, {6, 14, "reg9"},
{15, MIN_REAL_CHIP_SIZE - 1, "reg1"}},
.initial_buf = {0x4, 0x4, 0x5, 0x5, 0x5, 0x5, 0x6, 0x6,
0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x7},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, 0x6, 0x6,
0x6, 0x6, 0x6, 0x6, 0x6, 0x6, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7,
0xa8, 0xa9, 0xaa, 0xab, 0xac, 0xad, 0xae, 0xaf},
.written_protected_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0x6, 0x6,
0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0xae, 0xaf},
.eraseblocks_expected = {{0xf, 0x1, TEST_ERASE_INJECTOR_1}, {0xe, 0x1, TEST_ERASE_INJECTOR_1},
{0x2, 0x2, TEST_ERASE_INJECTOR_2}, {0x4, 0x2, TEST_ERASE_INJECTOR_2},
{0x0, 0x2, TEST_ERASE_INJECTOR_2}},
.eraseblocks_expected_ind = 5,
.erase_test_name = "Erase protected region test case #3",
.write_test_name = "Write protected region test case #3",
}, {
/*
* Test case #4
*
* Initial vs written: all 16 bytes are different.
* Layout with unaligned region 3+13b which require use of the 1-byte erase block.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, 2, "reg3"}, {3, MIN_REAL_CHIP_SIZE - 1, "tail"}},
.initial_buf = {0x4, 0x4, 0x4, 0x6, 0x6, 0x6, 0x6, 0x6,
0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, 0x6, 0x6,
0x6, 0x6, 0x6, 0x6, 0x6, 0x6, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7,
0xa8, 0xa9, 0xaa, 0xab, 0xac, 0xad, 0xae, 0xaf},
.written_protected_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0x6, 0x6,
0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0xae, 0xaf},
.eraseblocks_expected = {
{0x3, 0x1, TEST_ERASE_INJECTOR_1},
{0x4, 0x1, TEST_ERASE_INJECTOR_1},
{0x5, 0x1, TEST_ERASE_INJECTOR_1},
{0xe, 0x1, TEST_ERASE_INJECTOR_1},
{0xf, 0x1, TEST_ERASE_INJECTOR_1},
{0x0, 0x1, TEST_ERASE_INJECTOR_1},
{0x1, 0x1, TEST_ERASE_INJECTOR_1},
{0x2, 0x1, TEST_ERASE_INJECTOR_1},
},
.eraseblocks_expected_ind = 8,
.erase_test_name = "Erase protected region test case #4",
.write_test_name = "Write protected region test case #4",
}, {
/*
* Test case #5
*
* Initial vs written: all 16 bytes are different.
* Layout with unaligned region 9+7b.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, 8, "reg9"}, {9, MIN_REAL_CHIP_SIZE - 1, "tail"}},
.initial_buf = {0x4, 0x4, 0x4, 0x4, 0x4, 0x4, 0x4, 0x4,
0x4, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, 0x4, 0x4,
0x4, 0x6, 0x6, 0x6, 0x6, 0x6, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7,
0xa8, 0xa9, 0xaa, 0xab, 0xac, 0xad, 0xae, 0xaf},
.written_protected_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0x4, 0x4,
0x4, 0x6, 0x6, 0x6, 0x6, 0x6, 0xae, 0xaf},
.eraseblocks_expected = {
{0xe, 0x1, TEST_ERASE_INJECTOR_1},
{0xf, 0x1, TEST_ERASE_INJECTOR_1},
{0x0, 0x1, TEST_ERASE_INJECTOR_1},
{0x1, 0x1, TEST_ERASE_INJECTOR_1},
{0x2, 0x1, TEST_ERASE_INJECTOR_1},
{0x3, 0x1, TEST_ERASE_INJECTOR_1},
{0x4, 0x1, TEST_ERASE_INJECTOR_1},
{0x5, 0x1, TEST_ERASE_INJECTOR_1},
},
.eraseblocks_expected_ind = 8,
.erase_test_name = "Erase protected region test case #5",
.write_test_name = "Write protected region test case #5",
},
};
static int setup(void **state) {
struct test_case *current_test_case = *state;
g_state.current_test_case = current_test_case;
return 0;
}
static int teardown(void **state) {
return 0;
}
/*
* Creates the array of tests for each test case in test_cases[].
* Each test_case produces two tests: one for erase and one for write operation.
* The caller needs to free the allocated memory.
*/
struct CMUnitTest *get_erase_func_algo_tests(size_t *num_tests) {
const size_t test_cases_num = ARRAY_SIZE(test_cases);
// Twice the number of test cases, because each test case is run twice: for erase and write.
struct CMUnitTest *all_cases = calloc(test_cases_num * 2, sizeof(struct CMUnitTest));
*num_tests = test_cases_num * 2;
for (size_t i = 0; i < test_cases_num; i++) {
all_cases[i] = (struct CMUnitTest) {
.name = test_cases[i].erase_test_name,
.setup_func = setup,
.teardown_func = teardown,
.initial_state = &test_cases[i],
.test_func = erase_function_algo_test_success,
};
all_cases[i + test_cases_num] = (struct CMUnitTest) {
.name = test_cases[i].write_test_name,
.setup_func = setup,
.teardown_func = teardown,
.initial_state = &test_cases[i],
.test_func = write_function_algo_test_success,
};
}
return all_cases;
}
static void test_erase_fails_for_unwritable_region(void **);
static void erase_unwritable_regions_skipflag_on_test_success(void **);
static void write_unwritable_regions_skipflag_on_test_success(void **);
/*
* Creates the array of tests for each test case in test_cases_protected_region[].
* The caller needs to free the allocated memory.
*/
struct CMUnitTest *get_erase_protected_region_algo_tests(size_t *num_tests) {
const size_t num_parameterized = ARRAY_SIZE(test_cases_protected_region);
const size_t num_unparameterized = 1;
// Twice the number of parameterized test cases, because each test case is run twice:
// for erase and write.
const size_t num_cases = num_parameterized * 2 + num_unparameterized;
struct CMUnitTest *all_cases = calloc(num_cases, sizeof(struct CMUnitTest));
*num_tests = num_cases;
for (size_t i = 0; i < num_parameterized; i++) {
all_cases[i] = (struct CMUnitTest) {
.name = test_cases_protected_region[i].erase_test_name,
.setup_func = setup,
.teardown_func = teardown,
.initial_state = &test_cases_protected_region[i],
.test_func = erase_unwritable_regions_skipflag_on_test_success,
};
all_cases[i + num_parameterized] = (struct CMUnitTest) {
.name = test_cases_protected_region[i].write_test_name,
.setup_func = setup,
.teardown_func = teardown,
.initial_state = &test_cases_protected_region[i],
.test_func = write_unwritable_regions_skipflag_on_test_success,
};
}
memcpy(
&all_cases[num_parameterized * 2],
(const struct CMUnitTest[]){
(const struct CMUnitTest) {
.name = "erase failure for unskipped unwritable regions",
.test_func = test_erase_fails_for_unwritable_region,
}
},
sizeof(*all_cases) * num_unparameterized
);
return all_cases;
}
/*
* This function is invoked for every test case in test_cases[],
* current test case is passed as an argument.
*/
void erase_function_algo_test_success(void **state)
{
struct test_case* current_test_case = *state;
int all_erase_tests_result = 0;
struct flashrom_flashctx flashctx = { 0 };
const char *param = ""; /* Default values for all params. */
struct flashrom_layout *layout;
setup_chip(&flashctx, &layout, param, current_test_case);
printf("%s started.\n", current_test_case->erase_test_name);
int ret = flashrom_flash_erase(&flashctx);
printf("%s returned %d.\n", current_test_case->erase_test_name, ret);
int chip_erased = !memcmp(g_state.buf, current_test_case->erased_buf, MOCK_CHIP_SIZE);
int eraseblocks_in_order = !memcmp(g_state.eraseblocks_actual,
current_test_case->eraseblocks_expected,
current_test_case->eraseblocks_expected_ind * sizeof(struct erase_invoke));
int eraseblocks_invocations = (g_state.eraseblocks_actual_ind ==
current_test_case->eraseblocks_expected_ind);
if (chip_erased)
printf("Erased chip memory state for %s is CORRECT\n",
current_test_case->erase_test_name);
else
printf("Erased chip memory state for %s is WRONG\n",
current_test_case->erase_test_name);
if (eraseblocks_in_order)
printf("Eraseblocks order of invocation for %s is CORRECT\n",
current_test_case->erase_test_name);
else
printf("Eraseblocks order of invocation for %s is WRONG\n",
current_test_case->erase_test_name);
if (eraseblocks_invocations)
printf("Eraseblocks number of invocations for %s is CORRECT\n",
current_test_case->erase_test_name);
else
printf("Eraseblocks number of invocations for %s is WRONG, expected %d actual %d\n",
current_test_case->erase_test_name,
current_test_case->eraseblocks_expected_ind,
g_state.eraseblocks_actual_ind);
all_erase_tests_result |= ret;
all_erase_tests_result |= !chip_erased;
all_erase_tests_result |= !eraseblocks_in_order;
all_erase_tests_result |= !eraseblocks_invocations;
teardown_chip(&layout);
assert_int_equal(0, all_erase_tests_result);
}
/*
* This function is invoked for every test case in test_cases[],
* current test case is passed as an argument.
*/
void write_function_algo_test_success(void **state)
{
struct test_case* current_test_case = *state;
int all_write_test_result = 0;
struct flashrom_flashctx flashctx = { 0 };
uint8_t newcontents[MIN_BUF_SIZE];
const char *param = ""; /* Default values for all params. */
struct flashrom_layout *layout;
setup_chip(&flashctx, &layout, param, current_test_case);
memcpy(&newcontents, current_test_case->written_buf, MOCK_CHIP_SIZE);
printf("%s started.\n", current_test_case->write_test_name);
int ret = flashrom_image_write(&flashctx, &newcontents, MIN_BUF_SIZE, NULL);
printf("%s returned %d.\n", current_test_case->write_test_name, ret);
int chip_written = !memcmp(g_state.buf, current_test_case->written_buf, MOCK_CHIP_SIZE);
if (chip_written)
printf("Written chip memory state for %s is CORRECT\n",
current_test_case->write_test_name);
else
printf("Written chip memory state for %s is WRONG\n",
current_test_case->write_test_name);
all_write_test_result |= ret;
all_write_test_result |= !chip_written;
teardown_chip(&layout);
assert_int_equal(0, all_write_test_result);
}
static void get_protected_region(const struct flashctx *flash, unsigned int addr, struct flash_region *region)
{
if (addr < 20)
printf("Inside test get_protected_region for addr=0x%x\n", addr);
if (addr < START_PROTECTED_REGION) {
region->name = strdup("not protected");
region->start = 0;
region->end = START_PROTECTED_REGION - 1;
region->read_prot = false;
region->write_prot = false;
} else if (addr <= END_PROTECTED_REGION) {
region->name = strdup("protected");
region->start = START_PROTECTED_REGION;
region->end = END_PROTECTED_REGION;
region->read_prot = true;
region->write_prot = true;
} else {
region->name = strdup("tail");
region->start = END_PROTECTED_REGION + 1;
region->end = flashrom_flash_getsize(flash) - 1;
region->read_prot = false;
region->write_prot = false;
}
}
static int block_erase_chip_with_protected_region(struct flashctx *flash, enum block_erase_func erase_func, unsigned int blockaddr, unsigned int blocklen)
{
if (blockaddr + blocklen <= MOCK_CHIP_SIZE) {
LOG_ERASE_FUNC;
/* Register eraseblock invocation. */
g_state.eraseblocks_actual[g_state.eraseblocks_actual_ind] = (struct erase_invoke){
.erase_func = erase_func,
.blocklen = blocklen,
.blockaddr = blockaddr,
};
g_state.eraseblocks_actual_ind++;
}
assert_in_range(blockaddr + blocklen, 0, MIN_REAL_CHIP_SIZE);
// Check we are not trying to erase protected region. This should not happen,
// because the logic should handle protected regions and never invoke erasefn
// for them. If this happens, means there is a bug in erasure logic, and test fails.
//
// Note: returning 1 instead of assert, so that the flow goes back to erasure code
// to clean up the memory after failed erase. Memory leaks are also tested by unit tests.
const unsigned int erase_op_size = 1 << (erase_func - TEST_ERASE_INJECTOR_1);
if (blocklen < erase_op_size) {
printf("Error: block length %d is smaller than erase_func length %d\n", blocklen, erase_op_size);
return 1;
}
if ((blockaddr >= START_PROTECTED_REGION && blockaddr <= END_PROTECTED_REGION)
|| (blockaddr + blocklen - 1 >= START_PROTECTED_REGION
&& blockaddr + blocklen - 1 <= END_PROTECTED_REGION)
|| (blockaddr < START_PROTECTED_REGION
&& blockaddr + blocklen + 1 > END_PROTECTED_REGION)) {
printf("Error: block with start=%d, len=%d overlaps protected region %d-%d\n",
blockaddr, blocklen, START_PROTECTED_REGION, END_PROTECTED_REGION);
return 1;
}
memset(&g_state.buf[blockaddr], ERASE_VALUE, blocklen);
return 0;
}
#define BLOCK_ERASE_PROTECTED_FUNC(i) static int block_erase_chip_with_protected_region_ ## i \
(struct flashctx *flash, unsigned int blockaddr, unsigned int blocklen) { \
return block_erase_chip_with_protected_region(flash, TEST_ERASE_INJECTOR_ ## i, blockaddr, blocklen); \
}
BLOCK_ERASE_PROTECTED_FUNC(1)
BLOCK_ERASE_PROTECTED_FUNC(2)
BLOCK_ERASE_PROTECTED_FUNC(3)
BLOCK_ERASE_PROTECTED_FUNC(4)
BLOCK_ERASE_PROTECTED_FUNC(5)
/*
* Runs the test cases that use protected flash regions (regions returned from
* get_flash_region() where write_prot is true) when the runtime flag to avoid
* writing to those regions is enabled.
*
* These tests verify that no protected region is erased, and that the erase
* commands used match the expected erase size (ensuring for example that a
* command erasing 16 bytes is not used when only 8 should be erased).
*/
static void erase_unwritable_regions_skipflag_on_test_success(void **state)
{
struct test_case* current_test_case = *state;
int all_erase_tests_result = 0;
struct flashrom_flashctx flashctx = { 0 };
const char *param = ""; /* Default values for all params. */
struct flashrom_layout *layout;
setup_chip(&flashctx, &layout, param, current_test_case);
// This test needs special block erase to emulate protected regions.
memcpy(g_test_erase_injector,
(erasefunc_t *const[]){
block_erase_chip_with_protected_region_1,
block_erase_chip_with_protected_region_2,
block_erase_chip_with_protected_region_3,
block_erase_chip_with_protected_region_4,
block_erase_chip_with_protected_region_5,
},
sizeof(g_test_erase_injector)
);
flashrom_flag_set(&flashctx, FLASHROM_FLAG_SKIP_UNWRITABLE_REGIONS, true);
// We use dummyflasher programmer in tests, but for this test we need to
// replace dummyflasher's default get_region fn with test one.
// The rest of master struct is fine for this test.
// Note dummyflasher registers multiple masters by default, so replace
// get_region for each of them.
flashctx.mst->spi.get_region = &get_protected_region;
flashctx.mst->opaque.get_region = &get_protected_region;
printf("%s started.\n", current_test_case->erase_test_name);
int ret = flashrom_flash_erase(&flashctx);
printf("%s returned %d.\n", current_test_case->erase_test_name, ret);
int chip_erased = !memcmp(g_state.buf, current_test_case->erased_buf, MOCK_CHIP_SIZE);
int eraseblocks_in_order = !memcmp(g_state.eraseblocks_actual,
current_test_case->eraseblocks_expected,
current_test_case->eraseblocks_expected_ind * sizeof(struct erase_invoke));
int eraseblocks_invocations = (g_state.eraseblocks_actual_ind ==
current_test_case->eraseblocks_expected_ind);
if (chip_erased)
printf("Erased chip memory state for %s is CORRECT\n",
current_test_case->erase_test_name);
else
printf("Erased chip memory state for %s is WRONG\n",
current_test_case->erase_test_name);
if (eraseblocks_in_order)
printf("Eraseblocks order of invocation for %s is CORRECT\n",
current_test_case->erase_test_name);
else
printf("Eraseblocks order of invocation for %s is WRONG\n",
current_test_case->erase_test_name);
if (eraseblocks_invocations)
printf("Eraseblocks number of invocations for %s is CORRECT\n",
current_test_case->erase_test_name);
else
printf("Eraseblocks number of invocations for %s is WRONG, expected %d actual %d\n",
current_test_case->erase_test_name,
current_test_case->eraseblocks_expected_ind,
g_state.eraseblocks_actual_ind);
all_erase_tests_result |= ret;
all_erase_tests_result |= !chip_erased;
all_erase_tests_result |= !eraseblocks_in_order;
all_erase_tests_result |= !eraseblocks_invocations;
teardown_chip(&layout);
assert_int_equal(0, all_erase_tests_result);
}
/*
* Runs the test cases that use protected flash regions (regions returned from
* get_flash_region() where write_prot is true) when the runtime flag to avoid
* writing to those regions is enabled.
*
* These tests verify that no protected region is written, i.e. protected region
* memory state stays untouched.
*/
static void write_unwritable_regions_skipflag_on_test_success(void **state) {
struct test_case* current_test_case = *state;
int all_write_tests_result = 0;
struct flashrom_flashctx flashctx = { 0 };
uint8_t newcontents[MIN_BUF_SIZE];
const char *param = ""; /* Default values for all params. */
struct flashrom_layout *layout;
setup_chip(&flashctx, &layout, param, current_test_case);
memcpy(&newcontents, current_test_case->written_buf, MOCK_CHIP_SIZE);
// This test needs special block erase to emulate protected regions.
memcpy(g_test_erase_injector,
(erasefunc_t *const[]){
block_erase_chip_with_protected_region_1,
block_erase_chip_with_protected_region_2,
block_erase_chip_with_protected_region_3,
block_erase_chip_with_protected_region_4,
block_erase_chip_with_protected_region_5,
},
sizeof(g_test_erase_injector)
);
flashrom_flag_set(&flashctx, FLASHROM_FLAG_SKIP_UNWRITABLE_REGIONS, true);
flashrom_flag_set(&flashctx, FLASHROM_FLAG_SKIP_UNREADABLE_REGIONS, true);
// We use dummyflasher programmer in tests, but for this test we need to
// replace dummyflasher's default get_region fn with test one.
// The rest of master struct is fine for this test.
// Note dummyflasher registers multiple masters by default, so replace
// get_region for each of them.
flashctx.mst->spi.get_region = &get_protected_region;
flashctx.mst->opaque.get_region = &get_protected_region;
printf("%s started.\n", current_test_case->write_test_name);
int ret = flashrom_image_write(&flashctx, &newcontents, MIN_BUF_SIZE, NULL);
printf("%s returned %d.\n", current_test_case->write_test_name, ret);
int chip_written = !memcmp(g_state.buf, current_test_case->written_protected_buf, MOCK_CHIP_SIZE);
if (chip_written)
printf("Written chip memory state for %s is CORRECT\n",
current_test_case->write_test_name);
else
printf("Written chip memory state for %s is WRONG\n",
current_test_case->write_test_name);
all_write_tests_result |= ret;
all_write_tests_result |= !chip_written;
teardown_chip(&layout);
assert_int_equal(0, all_write_tests_result);
}
static void test_erase_fails_for_unwritable_region(void **state) {
struct flashrom_flashctx flashctx = {
.chip = &chip_1_2_4_8_16,
};
assert_int_equal(0, programmer_init(&programmer_dummy, ""));
flashctx.mst = &registered_masters[0];
flashctx.mst->spi.get_region = &get_protected_region;
flashctx.mst->opaque.get_region = &get_protected_region;
flashrom_flag_set(&flashctx, FLASHROM_FLAG_SKIP_UNWRITABLE_REGIONS, false);
/* Ask to erase one byte at the end of the unprotected region and one byte
* at the beginning of the protected one. If the check for unwritable regions
* wrongly treats the upper bound as exclusive, it will incorrectly try
* to erase inside the protected region. */
struct flashrom_layout *layout;
flashrom_layout_new(&layout);
flashrom_layout_add_region(layout, 7, 8, "protected");
flashrom_layout_include_region(layout, "protected");
flashrom_layout_set(&flashctx, layout);
int ret = flashrom_flash_erase(&flashctx);
assert_int_equal(0, programmer_shutdown());
flashrom_layout_release(layout);
assert_int_not_equal(ret, 0);
}
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