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79e2bd045c
Lifecycle tests are getting an upgrade in this chain, with new type of tests: lifecycle with probing. Existing lifecycle, being the simplest possible one becomes "basic lifecycle". With time, most of existing tests will be upgraded to probing lifecycle, however not necessarily all of them. Basic lifecycle will likely to stay as an option. This can be convenient, for a developer who wishes to add a test for a programmer, to have a choice of basic and extended option. BUG=b:181803212 TEST=ninja test Change-Id: I2771921ae2bd37f4b3f49342e03d9abb5ee36ea0 Signed-off-by: Anastasia Klimchuk <aklm@chromium.org> Reviewed-on: https://review.coreboot.org/c/flashrom/+/59740 Tested-by: build bot (Jenkins) <no-reply@coreboot.org> Reviewed-by: Thomas Heijligen <src@posteo.de> Reviewed-by: Edward O'Callaghan <quasisec@chromium.org>
71 lines
2.7 KiB
C
71 lines
2.7 KiB
C
/*
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* This file is part of the flashrom project.
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*
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* Copyright 2020 Google LLC
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*
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* This program is free software; you can redistribute it and/or modify
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* it under the terms of the GNU General Public License as published by
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* the Free Software Foundation; version 2 of the License.
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*
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* This program is distributed in the hope that it will be useful,
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* but WITHOUT ANY WARRANTY; without even the implied warranty of
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* MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
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* GNU General Public License for more details.
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*/
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#ifndef TESTS_H
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#define TESTS_H
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/* helpers.c */
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void address_to_bits_test_success(void **state);
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void bitcount_test_success(void **state);
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void minmax_test_success(void **state);
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void strcat_realloc_test_success(void **state);
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void tolower_string_test_success(void **state);
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void reverse_byte_test_success(void **state);
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void reverse_bytes_test_success(void **state);
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/* flashrom.c */
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void flashbuses_to_text_test_success(void **state);
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/* spi25.c */
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void spi_write_enable_test_success(void **state);
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void spi_write_disable_test_success(void **state);
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void probe_spi_rdid_test_success(void **state);
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void probe_spi_rdid4_test_success(void **state);
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void probe_spi_rems_test_success(void **state);
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void probe_spi_res1_test_success(void **state);
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void probe_spi_res2_test_success(void **state);
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void probe_spi_res3_test_success(void **state);
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void probe_spi_at25f_test_success(void **state);
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void probe_spi_st95_test_success(void **state); /* spi95.c */
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/* lifecycle.c */
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void dummy_basic_lifecycle_test_success(void **state);
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void nicrealtek_basic_lifecycle_test_success(void **state);
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void raiden_debug_basic_lifecycle_test_success(void **state);
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void dediprog_basic_lifecycle_test_success(void **state);
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void linux_mtd_basic_lifecycle_test_success(void **state);
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void linux_spi_basic_lifecycle_test_success(void **state);
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void realtek_mst_basic_lifecycle_test_success(void **state);
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/* layout.c */
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void included_regions_dont_overlap_test_success(void **state);
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void included_regions_overlap_test_success(void **state);
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void region_not_included_overlap_test_success(void **state);
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void layout_pass_sanity_checks_test_success(void **state);
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void layout_region_invalid_address_test_success(void **state);
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void layout_region_invalid_range_test_success(void **state);
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/* chip.c */
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void erase_chip_test_success(void **state);
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void erase_chip_with_dummyflasher_test_success(void **state);
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void read_chip_test_success(void **state);
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void read_chip_with_dummyflasher_test_success(void **state);
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void write_chip_test_success(void **state);
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void write_chip_with_dummyflasher_test_success(void **state);
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void verify_chip_test_success(void **state);
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void verify_chip_with_dummyflasher_test_success(void **state);
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#endif /* TESTS_H */
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