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bc3f2f84f9460713589a2d857f39fb57065ae89c
flashrom/tests/erase_func_algo.c
Anastasia Klimchuk 7d6a243779 tests: Use SPDX in headers 
Change-Id: I3a8a8e59cbed871e0ecf953e547de56c0656e112
Signed-off-by: Anastasia Klimchuk <aklm@flashrom.org>
Reviewed-on: https://review.coreboot.org/c/flashrom/+/89361
Reviewed-by: Stefan Reinauer <stefan.reinauer@coreboot.org>
Reviewed-by: Peter Marheine <pmarheine@chromium.org>
Reviewed-by: Antonio Vázquez Blanco <antoniovazquezblanco@gmail.com>
Tested-by: build bot (Jenkins) <no-reply@coreboot.org>
2025-10-11 06:02:44 +00:00

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/*
* This file is part of the flashrom project.
*
* SPDX-License-Identifier: GPL-2.0-only
*/
#include <include/test.h>
#include <stdio.h>
#include <stdlib.h>
#include <string.h>
#include "tests.h"
#include "chipdrivers.h"
#include "flash.h"
#include "io_mock.h"
#include "libflashrom.h"
#include "programmer.h"
#define LOG_ERASE_FUNC printf("Eraser called with blockaddr=0x%x, blocklen=0x%x, erase_func=%d\n", blockaddr, blocklen, erase_func - TEST_ERASE_INJECTOR_1 + 1)
#define LOG_READ_WRITE_FUNC printf("%s called with start=0x%x, len=0x%x\n", __func__, start, len)
#define ERASE_VALUE 0xff
#define MOCK_CHIP_SIZE 16
#define MIN_BUF_SIZE 1024 /* Minimum buffer size flashrom operates for chip operations. */
#define MIN_REAL_CHIP_SIZE 1024 /* Minimum chip size that can be defined for real chip in flashchips */
struct test_region {
const size_t start;
const size_t end;
const char *name;
};
struct erase_invoke {
unsigned int blockaddr;
unsigned int blocklen;
enum block_erase_func erase_func;
};
struct test_case {
struct flashchip *chip; /* Chip definition. */
struct test_region regions[MOCK_CHIP_SIZE]; /* Layout regions. */
uint8_t initial_buf[MOCK_CHIP_SIZE]; /* Initial state of chip memory. */
uint8_t erased_buf[MOCK_CHIP_SIZE]; /* Expected content after erase. */
uint8_t written_buf[MOCK_CHIP_SIZE]; /* Expected content after write. */
uint8_t written_protected_buf[MOCK_CHIP_SIZE]; /* Expected content after write with protected region. */
struct erase_invoke eraseblocks_expected[MOCK_CHIP_SIZE]; /* Expected order of eraseblocks invocations. */
unsigned int eraseblocks_expected_ind; /* Expected number of eraseblocks invocations. */
struct erase_invoke write_eraseblocks_expected[MOCK_CHIP_SIZE]; /* Expected order of eraseblocks invocations. */
unsigned int write_eraseblocks_expected_ind; /* Expected number of eraseblocks invocations. */
char erase_test_name[40]; /* Test case display name for testing erase operation. */
char write_test_name[40]; /* Test case display name for testing write operation. */
};
struct all_state {
uint8_t buf[MIN_REAL_CHIP_SIZE]; /* Buffer emulating the memory of the mock chip. */
bool was_modified[MIN_REAL_CHIP_SIZE]; /* Which bytes were modified, 0x1 if byte was modified. */
bool was_verified[MIN_REAL_CHIP_SIZE]; /* Which bytes were verified, 0x1 if byte was verified. */
struct erase_invoke eraseblocks_actual[MOCK_CHIP_SIZE]; /* The actual order of eraseblocks invocations. */
unsigned int eraseblocks_actual_ind; /* Actual number of eraseblocks invocations. */
const struct test_case* current_test_case; /* Currently executed test case. */
} g_state;
static int read_chip(struct flashctx *flash, uint8_t *buf, unsigned int start, unsigned int len)
{
if (start < MOCK_CHIP_SIZE)
LOG_READ_WRITE_FUNC;
assert_in_range(start + len, 0, MIN_REAL_CHIP_SIZE);
memcpy(buf, &g_state.buf[start], len);
/* If these bytes were modified before => current read op is verify op, track it */
bool bytes_modified = false;
for (unsigned int i = start; i < start + len; i++)
if (g_state.was_modified[i]) {
bytes_modified = true;
break;
}
if (bytes_modified)
memset(&g_state.was_verified[start], true, len);
return 0;
}
static int write_chip(struct flashctx *flash, const uint8_t *buf, unsigned int start, unsigned int len)
{
if (start < MOCK_CHIP_SIZE)
LOG_READ_WRITE_FUNC;
assert_in_range(start + len, 0, MIN_REAL_CHIP_SIZE);
memcpy(&g_state.buf[start], buf, len);
/* Track the bytes were written */
memset(&g_state.was_modified[start], true, len);
/* Clear the records of previous verification, if there were any */
memset(&g_state.was_verified[start], false, len);
return 0;
}
static int block_erase_chip_tagged(struct flashctx *flash, enum block_erase_func erase_func, unsigned int blockaddr, unsigned int blocklen)
{
if (blockaddr < MOCK_CHIP_SIZE) {
LOG_ERASE_FUNC;
/* Register eraseblock invocation. */
g_state.eraseblocks_actual[g_state.eraseblocks_actual_ind] = (struct erase_invoke){
.blocklen = blocklen,
.blockaddr = blockaddr,
.erase_func = erase_func,
};
g_state.eraseblocks_actual_ind++;
}
assert_in_range(blockaddr + blocklen, 0, MIN_REAL_CHIP_SIZE);
memset(&g_state.buf[blockaddr], ERASE_VALUE, blocklen);
/* Track the bytes were erased */
memset(&g_state.was_modified[blockaddr], true, blocklen);
/* Clear the records of previous verification, if there were any */
memset(&g_state.was_verified[blockaddr], false, blocklen);
return 0;
}
static struct flashchip chip_1_2_4_8_16 = {
.vendor = "aklm",
/*
* total_size is supposed to be in Kilobytes and this number is multiplied
* by 1024 everywhere in flashrom code. With this, we can't have the chip of
* size MOCK_CHIP_SIZE anyway, because MOCK_CHIP_SIZE is much smaller than
* 1024.
*
* So setting 1 here as this is the smallest possible value of unsigned int.
* Why aim for the smallest value? Because various places in flashrom code
* are allocating buffers of size total_size * 1024, however in these unit
* tests only MOCK_CHIP_SIZE bytes are tracked/logged/asserted.
*/
.total_size = 1,
.tested = TEST_OK_PREW,
.gran = WRITE_GRAN_1BYTE,
.read = TEST_READ_INJECTOR,
.write = TEST_WRITE_INJECTOR,
.block_erasers =
{
{
.eraseblocks = { {1, MIN_REAL_CHIP_SIZE} },
.block_erase = TEST_ERASE_INJECTOR_1,
}, {
.eraseblocks = { {2, MIN_REAL_CHIP_SIZE / 2} },
.block_erase = TEST_ERASE_INJECTOR_2,
}, {
.eraseblocks = { {4, MIN_REAL_CHIP_SIZE / 4} },
.block_erase = TEST_ERASE_INJECTOR_3,
}, {
.eraseblocks = { {8, MIN_REAL_CHIP_SIZE / 8} },
.block_erase = TEST_ERASE_INJECTOR_4,
}, {
.eraseblocks = { {16, MIN_REAL_CHIP_SIZE / 16} },
.block_erase = TEST_ERASE_INJECTOR_5,
}
},
};
static struct flashchip chip_1_8_16 = {
.vendor = "aklm",
/* See comment on previous chip. */
.total_size = 1,
.tested = TEST_OK_PREW,
.gran = WRITE_GRAN_1BYTE,
.read = TEST_READ_INJECTOR,
.write = TEST_WRITE_INJECTOR,
.block_erasers =
{
{
.eraseblocks = { {1, MIN_REAL_CHIP_SIZE} },
.block_erase = TEST_ERASE_INJECTOR_1,
}, {
.eraseblocks = { {8, MIN_REAL_CHIP_SIZE / 8} },
.block_erase = TEST_ERASE_INJECTOR_4,
}, {
.eraseblocks = { {16, MIN_REAL_CHIP_SIZE / 16} },
.block_erase = TEST_ERASE_INJECTOR_5,
}
},
};
static struct flashchip chip_8_16 = {
.vendor = "aklm",
/* See comment on previous chip. */
.total_size = 1,
.tested = TEST_OK_PREW,
.gran = WRITE_GRAN_1BYTE,
.read = TEST_READ_INJECTOR,
.write = TEST_WRITE_INJECTOR,
.block_erasers =
{
{
.eraseblocks = { {8, MIN_REAL_CHIP_SIZE / 8} },
.block_erase = TEST_ERASE_INJECTOR_4,
}, {
.eraseblocks = { {16, MIN_REAL_CHIP_SIZE / 16} },
.block_erase = TEST_ERASE_INJECTOR_5,
}
},
};
static struct flashchip chip_1_4_16 = {
.vendor = "aklm",
/* See comment on previous chip. */
.total_size = 1,
.tested = TEST_OK_PREW,
.gran = WRITE_GRAN_1BYTE,
.read = TEST_READ_INJECTOR,
.write = TEST_WRITE_INJECTOR,
.block_erasers =
{
{
.eraseblocks = { {1, MIN_REAL_CHIP_SIZE} },
.block_erase = TEST_ERASE_INJECTOR_1,
}, {
.eraseblocks = { {4, MIN_REAL_CHIP_SIZE / 4} },
.block_erase = TEST_ERASE_INJECTOR_3,
}, {
.eraseblocks = { {16, MIN_REAL_CHIP_SIZE / 16} },
.block_erase = TEST_ERASE_INJECTOR_5,
}
},
};
#define BLOCK_ERASE_FUNC(n) \
static int block_erase_chip_ ## n (struct flashctx *flash, unsigned int blockaddr, unsigned int blocklen) { \
return block_erase_chip_tagged(flash, TEST_ERASE_INJECTOR_ ## n, blockaddr, blocklen); \
}
BLOCK_ERASE_FUNC(1)
BLOCK_ERASE_FUNC(2)
BLOCK_ERASE_FUNC(3)
BLOCK_ERASE_FUNC(4)
BLOCK_ERASE_FUNC(5)
/*
* Returns the offset how far we need to verify mock chip memory.
* Which is minimum out of MOCK_CHIP_SIZE and the end of the logical layout.
*/
static chipoff_t setup_chip(struct flashrom_flashctx *flashctx, struct flashrom_layout **layout,
const char *programmer_param, struct test_case *current_test_case)
{
chipoff_t verify_end_boundary = MOCK_CHIP_SIZE - 1;
g_test_write_injector = write_chip;
g_test_read_injector = read_chip;
/* Each erasefunc corresponds to an operation that erases a block of
* the chip with a particular size in bytes. */
memcpy(g_test_erase_injector,
(erasefunc_t *const[]){
block_erase_chip_1, // 1 byte
block_erase_chip_2, // 2 bytes
block_erase_chip_3, // 4 bytes
block_erase_chip_4, // 8 bytes
block_erase_chip_5, // 16 bytes
},
sizeof(g_test_erase_injector)
);
/* First MOCK_CHIP_SIZE bytes have a meaning and set with given values for this test case. */
memcpy(g_state.buf, current_test_case->initial_buf, MOCK_CHIP_SIZE);
/* The rest of mock chip memory does not matter. */
memset(g_state.buf + MOCK_CHIP_SIZE, ERASE_VALUE, MIN_REAL_CHIP_SIZE - MOCK_CHIP_SIZE);
/* Clear eraseblock invocation records. */
memset(g_state.eraseblocks_actual, 0, MOCK_CHIP_SIZE * sizeof(struct erase_invoke));
g_state.eraseblocks_actual_ind = 0;
/* Clear the tracking of each byte modified. */
memset(g_state.was_modified, false, MIN_REAL_CHIP_SIZE);
/* Clear the tracking of each byte verified. */
memset(g_state.was_verified, false, MIN_REAL_CHIP_SIZE);
/* Set the flag to verify after writing on chip */
flashrom_flag_set(flashctx, FLASHROM_FLAG_VERIFY_AFTER_WRITE, true);
flashctx->chip = current_test_case->chip;
printf("Creating layout ... ");
assert_int_equal(0, flashrom_layout_new(layout));
/* Adding regions from test case. */
int i = 0;
while (current_test_case->regions[i].name != NULL) {
assert_int_equal(0, flashrom_layout_add_region(*layout,
current_test_case->regions[i].start,
current_test_case->regions[i].end,
current_test_case->regions[i].name));
assert_int_equal(0, flashrom_layout_include_region(*layout, current_test_case->regions[i].name));
if (current_test_case->regions[i].end < MOCK_CHIP_SIZE - 1)
verify_end_boundary = current_test_case->regions[i].end;
else
verify_end_boundary = MOCK_CHIP_SIZE - 1;
i++;
}
flashrom_layout_set(flashctx, *layout);
printf("done\n");
/*
* We need some programmer (any), and dummy is a very good one,
* because it doesn't need any mocking. So no extra complexity
* from a programmer side, and test can focus on working with the chip.
*/
printf("Dummyflasher initialising with param=\"%s\"... ", programmer_param);
assert_int_equal(0, programmer_init(&programmer_dummy, programmer_param));
/* Assignment below normally happens while probing, but this test is not probing. */
flashctx->mst = &registered_masters[0];
printf("done\n");
return verify_end_boundary;
}
static void teardown_chip(struct flashrom_layout **layout)
{
printf("Dummyflasher shutdown... ");
assert_int_equal(0, programmer_shutdown());
printf("done\n");
printf("Releasing layout... ");
flashrom_layout_release(*layout);
printf("done\n");
}
/*
* Setup all test cases.
*
* First half of test cases is set up for a chip with erasers: 1, 2, 4, 8, 16 bytes.
* Second half repeates the same test cases for a chip with erasers: 1, 8, 16 bytes.
* Tests from #16 onwards use the chip with erasers: 8, 16 bytes, to test unaligned layout regions.
*/
static struct test_case test_cases[] = {
{
/*
* Test case #0
*
* Initial vs written: all 16 bytes are different.
* One layout region for the whole chip.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0x0, 0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7, 0x8,
0x9, 0xa, 0xb, 0xc, 0xd, 0xe, 0xf},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x10, 0x11, 0x12, 0x13, 0x14, 0x15, 0x16, 0x17, 0x18,
0x19, 0x1a, 0x1b, 0x1c, 0x1d, 0x1e, 0x1f},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.write_eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.write_eraseblocks_expected_ind = 1,
.erase_test_name = "Erase test case #0",
.write_test_name = "Write test case #0",
}, {
/*
* Test case #1
*
* Initial vs written: 9 bytes the same, 7 bytes different.
* Two layout regions each one 8 bytes, which is 1/2 size of chip.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, MOCK_CHIP_SIZE/2 - 1, "part1"}, {MOCK_CHIP_SIZE/2, MIN_REAL_CHIP_SIZE - 1, "part2"}},
.initial_buf = {0xf0, 0xf1, 0xf2, 0xf3, 0xf4, 0xf5, 0xf6, 0xf7,
0xf8, 0xf9, 0xfa, 0xfb, 0xfc, 0xfd, 0xfe, 0xf1},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xf0, 0xf1, 0xf2, 0xf3, 0xf4, 0xf5, 0xf6, 0xf7, 0xf8,
0x29, 0x2a, 0x2b, 0x2c, 0x2d, 0x2e, 0x2f},
.eraseblocks_expected = {{0x8, 0x8, TEST_ERASE_INJECTOR_4}, {0x0, 0x8, TEST_ERASE_INJECTOR_4}},
.eraseblocks_expected_ind = 2,
.write_eraseblocks_expected = {{0x9, 0x1, TEST_ERASE_INJECTOR_1},
{0xa, 0x2, TEST_ERASE_INJECTOR_2},
{0xc, 0x4, TEST_ERASE_INJECTOR_3}},
.write_eraseblocks_expected_ind = 3,
.erase_test_name = "Erase test case #1",
.write_test_name = "Write test case #1",
}, {
/*
* Test case #2
*
* Initial vs written: 6 bytes the same, 4 bytes different, 4 bytes the same, 2 bytes different.
* Two layout regions 11 and 5 bytes each.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, 10, "odd1"}, {11, 15, "odd2"}, {MOCK_CHIP_SIZE, MIN_REAL_CHIP_SIZE - 1, "longtail"}},
.initial_buf = {0xff, 0xff, 0x0, 0xff, 0x0, 0xff, 0x0, 0xff,
0x0, 0xff, 0x0, 0xff, 0xff, 0xff, 0xff, 0xff},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xff, 0xff, 0x0, 0xff, 0x0, 0xff, 0x20, 0x2f,
0x20, 0x2f, 0x0, 0xff, 0xff, 0xff, 0x2f, 0x2f},
.eraseblocks_expected = {
{0xb, 0x1, TEST_ERASE_INJECTOR_1},
{0xc, 0x4, TEST_ERASE_INJECTOR_3},
{0xa, 0x1, TEST_ERASE_INJECTOR_1},
{0x8, 0x2, TEST_ERASE_INJECTOR_2},
{0x0, 0x8, TEST_ERASE_INJECTOR_4}
},
.eraseblocks_expected_ind = 5,
.write_eraseblocks_expected = {
{0x6, 0x1, TEST_ERASE_INJECTOR_1},
{0x8, 0x1, TEST_ERASE_INJECTOR_1}
},
.write_eraseblocks_expected_ind = 2,
.erase_test_name = "Erase test case #2",
.write_test_name = "Write test case #2",
}, {
/*
* Test case #3
*
* Initial vs written: 4 bytes the same, 4 bytes different, 8 bytes the same.
* One layout region covering the whole chip.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0xff, 0xff, 0xff, 0xff, 0x11, 0x22, 0x33, 0x44,
0xff, 0xff, 0xff, 0xff, 0xff, 0xff, 0xff, 0xff},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xff, 0xff, 0xff, 0xff, 0x1, 0x2, 0x3, 0x4,
0xff, 0xff, 0xff, 0xff, 0xff, 0xff, 0xff, 0xff},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.write_eraseblocks_expected = {{0x4, 0x4, TEST_ERASE_INJECTOR_3}},
.write_eraseblocks_expected_ind = 1,
.erase_test_name = "Erase test case #3",
.write_test_name = "Write test case #3",
}, {
/*
* Test case #4
*
* Initial vs written: 4 bytes different, 4 bytes the same, 8 bytes different.
* One layout region covering the whole chip.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0x1, 0x2, 0x3, 0x4, 0xff, 0xff, 0xff, 0xff,
0x11, 0x12, 0x13, 0x14, 0x15, 0x16, 0x17, 0x18},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x11, 0x22, 0x33, 0x44, 0xff, 0xff, 0xff, 0xff,
0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7, 0xa8},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.write_eraseblocks_expected = {{0x0, 0x4, TEST_ERASE_INJECTOR_3}, {0x8, 0x8, TEST_ERASE_INJECTOR_4}},
.write_eraseblocks_expected_ind = 2,
.erase_test_name = "Erase test case #4",
.write_test_name = "Write test case #4",
}, {
/*
* Test case #5
*
* Initial vs written: 7 bytes different, 1 bytes the same, 8 bytes different.
* One layout region covering the whole chip.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7, 0xff,
0x11, 0x12, 0x13, 0x14, 0x15, 0x16, 0x17, 0x18},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x11, 0x22, 0x33, 0x44, 0x55, 0x66, 0x77, 0xff,
0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7, 0xa8},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.write_eraseblocks_expected = {{0x6, 0x1, TEST_ERASE_INJECTOR_1},
{0x4, 0x2, TEST_ERASE_INJECTOR_2},
{0x0, 0x4, TEST_ERASE_INJECTOR_3},
{0x8, 0x8, TEST_ERASE_INJECTOR_4}},
.write_eraseblocks_expected_ind = 4,
.erase_test_name = "Erase test case #5",
.write_test_name = "Write test case #5",
}, {
/*
* Test case #6
*
* Initial vs written: 7 bytes the same, 1 bytes different, 8 bytes the same.
* One layout region covering the whole chip.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7, 0x1d,
0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7, 0xa8},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7, 0xdd,
0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7, 0xa8},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.write_eraseblocks_expected = {{0x7, 0x1, TEST_ERASE_INJECTOR_1}},
.write_eraseblocks_expected_ind = 1,
.erase_test_name = "Erase test case #6",
.write_test_name = "Write test case #6",
}, {
/*
* Test case #7
*
* Initial vs written: all 16 bytes are different.
* Layout with irregular regions unaligned with eraseblocks.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, 2, "reg3"}, {3, 7, "reg5"}, {8, 14, "reg7"}, {15, MIN_REAL_CHIP_SIZE - 1, "reg1"}},
.initial_buf = {0x0, 0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7,
0x8, 0x9, 0xa, 0xb, 0xc, 0xd, 0xe, 0xf},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x10, 0x11, 0x12, 0x13, 0x14, 0x15, 0x16, 0x17,
0x18, 0x19, 0x1a, 0x1b, 0x1c, 0x1d, 0x1e, 0x1f},
.eraseblocks_expected = {
{0xf, 0x1, TEST_ERASE_INJECTOR_1},
{0xe, 0x1, TEST_ERASE_INJECTOR_1},
{0xc, 0x2, TEST_ERASE_INJECTOR_2},
{0x8, 0x4, TEST_ERASE_INJECTOR_3},
{0x3, 0x1, TEST_ERASE_INJECTOR_1},
{0x4, 0x4, TEST_ERASE_INJECTOR_3},
{0x2, 0x1, TEST_ERASE_INJECTOR_1},
{0x0, 0x2, TEST_ERASE_INJECTOR_2}
},
.eraseblocks_expected_ind = 8,
.write_eraseblocks_expected = {
{0xf, 0x1, TEST_ERASE_INJECTOR_1},
{0xe, 0x1, TEST_ERASE_INJECTOR_1},
{0xc, 0x2, TEST_ERASE_INJECTOR_2},
{0x8, 0x4, TEST_ERASE_INJECTOR_3},
{0x3, 0x1, TEST_ERASE_INJECTOR_1},
{0x4, 0x4, TEST_ERASE_INJECTOR_3},
{0x2, 0x1, TEST_ERASE_INJECTOR_1},
{0x0, 0x2, TEST_ERASE_INJECTOR_2}
},
.write_eraseblocks_expected_ind = 8,
.erase_test_name = "Erase test case #7",
.write_test_name = "Write test case #7",
}, {
/*
* Test case #8
*
* Initial vs written: all 16 bytes are different.
* One layout region for the whole chip.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0x0, 0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7,
0x8, 0x9, 0xa, 0xb, 0xc, 0xd, 0xe, 0xf},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x10, 0x11, 0x12, 0x13, 0x14, 0x15, 0x16, 0x17,
0x18, 0x19, 0x1a, 0x1b, 0x1c, 0x1d, 0x1e, 0x1f},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.write_eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.write_eraseblocks_expected_ind = 1,
.erase_test_name = "Erase test case #8",
.write_test_name = "Write test case #8",
}, {
/*
* Test case #9
*
* Initial vs written: 9 bytes the same, 7 bytes different.
* Two layout regions each one 8 bytes, which is 1/2 size of chip.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, MOCK_CHIP_SIZE/2 - 1, "part1"}, {MOCK_CHIP_SIZE/2, MOCK_CHIP_SIZE - 1, "part2"},
{MOCK_CHIP_SIZE, MIN_REAL_CHIP_SIZE - 1, "longtail"}},
.initial_buf = {0xf0, 0xf1, 0xf2, 0xf3, 0xf4, 0xf5, 0xf6, 0xf7,
0xf8, 0xf9, 0xfa, 0xfb, 0xfc, 0xfd, 0xfe, 0xf1},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xf0, 0xf1, 0xf2, 0xf3, 0xf4, 0xf5, 0xf6, 0xf7,
0xf8, 0x29, 0x2a, 0x2b, 0x2c, 0x2d, 0x2e, 0x2f},
.eraseblocks_expected = {{0x8, 0x8, TEST_ERASE_INJECTOR_4}, {0x0, 0x8, TEST_ERASE_INJECTOR_4}},
.eraseblocks_expected_ind = 2,
.write_eraseblocks_expected = {{0x9, 0x1, TEST_ERASE_INJECTOR_1},
{0xa, 0x1, TEST_ERASE_INJECTOR_1},
{0xb, 0x1, TEST_ERASE_INJECTOR_1},
{0xc, 0x1, TEST_ERASE_INJECTOR_1},
{0xd, 0x1, TEST_ERASE_INJECTOR_1},
{0xe, 0x1, TEST_ERASE_INJECTOR_1},
{0xf, 0x1, TEST_ERASE_INJECTOR_1}},
.write_eraseblocks_expected_ind = 7,
.erase_test_name = "Erase test case #9",
.write_test_name = "Write test case #9",
}, {
/*
* Test case #10
*
* Initial vs written: 6 bytes the same, 4 bytes different, 4 bytes the same, 2 bytes different.
* Two layout regions 11 and 5 bytes each.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, 10, "odd1"}, {11, 15, "odd2"}, {MOCK_CHIP_SIZE, MIN_REAL_CHIP_SIZE - 1, "longtail"}},
.initial_buf = {0xff, 0xff, 0x0, 0xff, 0x0, 0xff, 0x0, 0xff,
0x0, 0xff, 0x0, 0xff, 0xff, 0xff, 0xff, 0xff},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xff, 0xff, 0x0, 0xff, 0x0, 0xff, 0x20, 0x2f,
0x20, 0x2f, 0x0, 0xff, 0xff, 0xff, 0x2f, 0x2f},
.eraseblocks_expected = {
{0xb, 0x1, TEST_ERASE_INJECTOR_1},
{0xc, 0x1, TEST_ERASE_INJECTOR_1},
{0xd, 0x1, TEST_ERASE_INJECTOR_1},
{0xe, 0x1, TEST_ERASE_INJECTOR_1},
{0xf, 0x1, TEST_ERASE_INJECTOR_1},
{0x8, 0x1, TEST_ERASE_INJECTOR_1},
{0x9, 0x1, TEST_ERASE_INJECTOR_1},
{0xa, 0x1, TEST_ERASE_INJECTOR_1},
{0x0, 0x8, TEST_ERASE_INJECTOR_4}
},
.eraseblocks_expected_ind = 9,
.write_eraseblocks_expected = {
{0x6, 0x1, TEST_ERASE_INJECTOR_1},
{0x8, 0x1, TEST_ERASE_INJECTOR_1}
},
.write_eraseblocks_expected_ind = 2,
.erase_test_name = "Erase test case #10",
.write_test_name = "Write test case #10",
}, {
/*
* Test case #11
*
* Initial vs written: 4 bytes the same, 4 bytes different, 8 bytes the same.
* One layout region covering the whole chip.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0xff, 0xff, 0xff, 0xff, 0x11, 0x22, 0x33, 0x44,
0xff, 0xff, 0xff, 0xff, 0xff, 0xff, 0xff, 0xff},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xff, 0xff, 0xff, 0xff, 0x1, 0x2, 0x3, 0x4,
0xff, 0xff, 0xff, 0xff, 0xff, 0xff, 0xff, 0xff},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.write_eraseblocks_expected = {{0x4, 0x1, TEST_ERASE_INJECTOR_1},
{0x5, 0x1, TEST_ERASE_INJECTOR_1},
{0x6, 0x1, TEST_ERASE_INJECTOR_1},
{0x7, 0x1, TEST_ERASE_INJECTOR_1}},
.write_eraseblocks_expected_ind = 4,
.erase_test_name = "Erase test case #11",
.write_test_name = "Write test case #11",
}, {
/*
* Test case #12
*
* Initial vs written: 4 bytes different, 4 bytes the same, 8 bytes different.
* One layout region covering the whole chip.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0x1, 0x2, 0x3, 0x4, 0xff, 0xff, 0xff, 0xff,
0x11, 0x12, 0x13, 0x14, 0x15, 0x16, 0x17, 0x18},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x11, 0x22, 0x33, 0x44, 0xff, 0xff, 0xff, 0xff,
0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7, 0xa8},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.write_eraseblocks_expected = {{0x0, 0x1, TEST_ERASE_INJECTOR_1},
{0x1, 0x1, TEST_ERASE_INJECTOR_1},
{0x2, 0x1, TEST_ERASE_INJECTOR_1},
{0x3, 0x1, TEST_ERASE_INJECTOR_1},
{0x8, 0x8, TEST_ERASE_INJECTOR_4}},
.write_eraseblocks_expected_ind = 5,
.erase_test_name = "Erase test case #12",
.write_test_name = "Write test case #12",
}, {
/*
* Test case #13
*
* Initial vs written: 7 bytes different, 1 bytes the same, 8 bytes different.
* One layout region covering the whole chip.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7, 0xff,
0x11, 0x12, 0x13, 0x14, 0x15, 0x16, 0x17, 0x18},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x11, 0x22, 0x33, 0x44, 0x55, 0x66, 0x77, 0xff,
0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7, 0xa8},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.write_eraseblocks_expected = {{0x0, 0x1, TEST_ERASE_INJECTOR_1},
{0x1, 0x1, TEST_ERASE_INJECTOR_1},
{0x2, 0x1, TEST_ERASE_INJECTOR_1},
{0x3, 0x1, TEST_ERASE_INJECTOR_1},
{0x4, 0x1, TEST_ERASE_INJECTOR_1},
{0x5, 0x1, TEST_ERASE_INJECTOR_1},
{0x6, 0x1, TEST_ERASE_INJECTOR_1},
{0x8, 0x8, TEST_ERASE_INJECTOR_4}},
.write_eraseblocks_expected_ind = 8,
.erase_test_name = "Erase test case #13",
.write_test_name = "Write test case #13",
}, {
/*
* Test case #14
*
* Initial vs written: 7 bytes the same, 1 bytes different, 8 bytes the same.
* One layout region covering the whole chip.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7, 0x1d,
0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7, 0xa8},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7, 0xdd,
0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7, 0xa8},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.write_eraseblocks_expected = {{0x7, 0x1, TEST_ERASE_INJECTOR_1}},
.write_eraseblocks_expected_ind = 1,
.erase_test_name = "Erase test case #14",
.write_test_name = "Write test case #14",
}, {
/*
* Test case #15
*
* Initial vs written: all 16 bytes are different.
* Layout with irregular regions unaligned with eraseblocks.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, 2, "reg3"}, {3, 7, "reg5"}, {8, 14, "reg7"},
{15, MIN_REAL_CHIP_SIZE - 1, "reg1"}},
.initial_buf = {0x0, 0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7,
0x8, 0x9, 0xa, 0xb, 0xc, 0xd, 0xe, 0xf},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x10, 0x11, 0x12, 0x13, 0x14, 0x15, 0x16, 0x17,
0x18, 0x19, 0x1a, 0x1b, 0x1c, 0x1d, 0x1e, 0x1f},
.eraseblocks_expected = {
{0xf, 0x1, TEST_ERASE_INJECTOR_1},
{0x8, 0x1, TEST_ERASE_INJECTOR_1},
{0x9, 0x1, TEST_ERASE_INJECTOR_1},
{0xa, 0x1, TEST_ERASE_INJECTOR_1},
{0xb, 0x1, TEST_ERASE_INJECTOR_1},
{0xc, 0x1, TEST_ERASE_INJECTOR_1},
{0xd, 0x1, TEST_ERASE_INJECTOR_1},
{0xe, 0x1, TEST_ERASE_INJECTOR_1},
{0x3, 0x1, TEST_ERASE_INJECTOR_1},
{0x4, 0x1, TEST_ERASE_INJECTOR_1},
{0x5, 0x1, TEST_ERASE_INJECTOR_1},
{0x6, 0x1, TEST_ERASE_INJECTOR_1},
{0x7, 0x1, TEST_ERASE_INJECTOR_1},
{0x0, 0x1, TEST_ERASE_INJECTOR_1},
{0x1, 0x1, TEST_ERASE_INJECTOR_1},
{0x2, 0x1, TEST_ERASE_INJECTOR_1},
},
.eraseblocks_expected_ind = 16,
.write_eraseblocks_expected = {
{0xf, 0x1, TEST_ERASE_INJECTOR_1},
{0x8, 0x1, TEST_ERASE_INJECTOR_1},
{0x9, 0x1, TEST_ERASE_INJECTOR_1},
{0xa, 0x1, TEST_ERASE_INJECTOR_1},
{0xb, 0x1, TEST_ERASE_INJECTOR_1},
{0xc, 0x1, TEST_ERASE_INJECTOR_1},
{0xd, 0x1, TEST_ERASE_INJECTOR_1},
{0xe, 0x1, TEST_ERASE_INJECTOR_1},
{0x3, 0x1, TEST_ERASE_INJECTOR_1},
{0x4, 0x1, TEST_ERASE_INJECTOR_1},
{0x5, 0x1, TEST_ERASE_INJECTOR_1},
{0x6, 0x1, TEST_ERASE_INJECTOR_1},
{0x7, 0x1, TEST_ERASE_INJECTOR_1},
{0x0, 0x1, TEST_ERASE_INJECTOR_1},
{0x1, 0x1, TEST_ERASE_INJECTOR_1},
{0x2, 0x1, TEST_ERASE_INJECTOR_1},
},
.write_eraseblocks_expected_ind = 16,
.erase_test_name = "Erase test case #15",
.write_test_name = "Write test case #15",
}, {
/*
* Test case #16
*
* Initial vs written: all 16 bytes are different.
* Layout with unaligned regions 2+4+9+1b which are smaller than the smallest eraseblock.
* Chip with eraseblocks 8, 16.
*/
.chip = &chip_8_16,
.regions = {{0, 1, "reg2"}, {2, 5, "reg4"}, {6, 14, "reg9"},
{15, MIN_REAL_CHIP_SIZE - 1, "reg1"}},
.initial_buf = {0x4, 0x4, 0x5, 0x5, 0x5, 0x5, 0x6, 0x6,
0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x7},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x14, 0x14, 0x15, 0x15, 0x15, 0x15, 0x16, 0x16,
0x16, 0x16, 0x16, 0x16, 0x16, 0x16, 0x16, 0x17},
.eraseblocks_expected = {
{0x8, 0x8, TEST_ERASE_INJECTOR_4},
{0x0, 0x10, TEST_ERASE_INJECTOR_5},
{0x0, 0x8, TEST_ERASE_INJECTOR_4},
{0x0, 0x8, TEST_ERASE_INJECTOR_4},
},
.eraseblocks_expected_ind = 4,
.write_eraseblocks_expected = {
{0x8, 0x8, TEST_ERASE_INJECTOR_4},
{0x0, 0x10, TEST_ERASE_INJECTOR_5},
{0x0, 0x8, TEST_ERASE_INJECTOR_4},
{0x0, 0x8, TEST_ERASE_INJECTOR_4},
},
.write_eraseblocks_expected_ind = 4,
.erase_test_name = "Erase test case #16",
.write_test_name = "Write test case #16",
}, {
/*
* Test case #17
*
* Initial vs written: all 16 bytes are different.
* Layout with unaligned region 3+13b which are smaller than the smallest eraseblock.
* Chip with eraseblocks 8, 16.
*/
.chip = &chip_8_16,
.regions = {{0, 2, "reg3"}, {3, MIN_REAL_CHIP_SIZE - 1, "tail"}},
.initial_buf = {0x4, 0x4, 0x4, 0x6, 0x6, 0x6, 0x6, 0x6,
0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x14, 0x14, 0x14, 0x16, 0x16, 0x16, 0x16, 0x16,
0x16, 0x16, 0x16, 0x16, 0x16, 0x16, 0x16, 0x16},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}, {0x0, 0x8, TEST_ERASE_INJECTOR_4}},
.eraseblocks_expected_ind = 2,
.write_eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}, {0x0, 0x8, TEST_ERASE_INJECTOR_4}},
.write_eraseblocks_expected_ind = 2,
.erase_test_name = "Erase test case #17",
.write_test_name = "Write test case #17",
}, {
/*
* Test case #18
*
* Initial vs written: all 16 bytes are different.
* Layout with unaligned region 9+7b.
* Chip with eraseblocks 8, 16.
*/
.chip = &chip_8_16,
.regions = {{0, 8, "reg9"}, {9, MIN_REAL_CHIP_SIZE - 1, "tail"}},
.initial_buf = {0x4, 0x4, 0x4, 0x4, 0x4, 0x4, 0x4, 0x4,
0x4, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x14, 0x14, 0x14, 0x14, 0x14, 0x14, 0x14, 0x14,
0x14, 0x16, 0x16, 0x16, 0x16, 0x16, 0x16, 0x16},
.eraseblocks_expected = {{0x8, 0x8, TEST_ERASE_INJECTOR_4}, {0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 2,
.write_eraseblocks_expected = {{0x8, 0x8, TEST_ERASE_INJECTOR_4}, {0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.write_eraseblocks_expected_ind = 2,
.erase_test_name = "Erase test case #18",
.write_test_name = "Write test case #18",
}, {
/*
* Test case #19
*
* Initial vs written: 3 bytes of the logical layout are different, rest is the same.
* Layout with unaligned region 3 bytes. Layout does not cover the whole chip memory.
* Chip memory outside of logical layout is skipped by both erase and write ops.
* Chip with eraseblocks 8, 16.
*/
.chip = &chip_8_16,
.regions = {{0, 2, "reg3"}},
.initial_buf = {0x4, 0x4, 0x4, 0x0, 0x0, 0x0, 0x0, 0x0,
0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, 0x0,
0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0},
.written_buf = {0x14, 0x14, 0x14, 0x0, 0x0, 0x0, 0x0, 0x0,
0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0, 0x0},
.eraseblocks_expected = {{0x0, 0x8, TEST_ERASE_INJECTOR_4}},
.eraseblocks_expected_ind = 1,
.write_eraseblocks_expected = {{0x0, 0x8, TEST_ERASE_INJECTOR_4}},
.write_eraseblocks_expected_ind = 1,
.erase_test_name = "Erase test case #19",
.write_test_name = "Write test case #19",
}, {
/*
* Test case #20
*
* Initial vs written: 3s+1d+3s+1d+3s+1d+3d+1s
* Layout with one region covering the whole chip
* Chip with eraseblocks 1, 4, 16.
*/
.chip = &chip_1_4_16,
.regions = {{0, MOCK_CHIP_SIZE - 1, "mock chip"}, {MOCK_CHIP_SIZE, MIN_REAL_CHIP_SIZE - 1, "longtail"}},
.initial_buf = {0x0, 0x1, 0x2, 0xf, 0x4, 0x5, 0x6, 0xf,
0x8, 0x9, 0xa, 0xf, 0xf, 0xf, 0xf, 0x1f},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0x01, 0x11, 0x22, 0xf, 0x44, 0x55, 0x66, 0xf,
0x88, 0x99, 0xaa, 0xf, 0xf, 0xf, 0xf, 0xf1},
.eraseblocks_expected = {{0x0, 0x10, TEST_ERASE_INJECTOR_5}},
.eraseblocks_expected_ind = 1,
.write_eraseblocks_expected = {{0x0, 0x1, TEST_ERASE_INJECTOR_1},
{0x1, 0x1, TEST_ERASE_INJECTOR_1},
{0x2, 0x1, TEST_ERASE_INJECTOR_1},
{0x4, 0x1, TEST_ERASE_INJECTOR_1},
{0x5, 0x1, TEST_ERASE_INJECTOR_1},
{0x6, 0x1, TEST_ERASE_INJECTOR_1},
{0x8, 0x1, TEST_ERASE_INJECTOR_1},
{0x9, 0x1, TEST_ERASE_INJECTOR_1},
{0xa, 0x1, TEST_ERASE_INJECTOR_1},
{0xf, 0x1, TEST_ERASE_INJECTOR_1}},
.write_eraseblocks_expected_ind = 10,
.erase_test_name = "Erase test case #20",
.write_test_name = "Write test case #20",
},
};
#define START_PROTECTED_REGION 6
#define END_PROTECTED_REGION 13
/*
* Setup all test cases with protected region.
* Protected region is the same for all test cases, between bytes START_PROTECTED_REGION and up to END_PROTECTED_REGION.
*/
static struct test_case test_cases_protected_region[] = {
{
/*
* Test case #0
*
* Initial vs written: all 16 bytes are different.
* One layout region for the whole chip.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, MIN_REAL_CHIP_SIZE - 1, "whole chip"}},
.initial_buf = {0x0, 0x1, 0x2, 0x3, 0x4, 0x5, 0x6, 0x7,
0x8, 0x9, 0xa, 0xb, 0xc, 0xd, 0xe, 0xf},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, 0x6, 0x7,
0x8, 0x9, 0xa, 0xb, 0xc, 0xd, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xf0, 0xf1, 0xf2, 0xf3, 0xf4, 0xf5, 0xf6, 0xf7,
0xf8, 0xf9, 0xfa, 0xfb, 0xfc, 0xfd, 0xfe, 0xff},
.written_protected_buf = {0xf0, 0xf1, 0xf2, 0xf3, 0xf4, 0xf5, 0x6, 0x7,
0x8, 0x9, 0xa, 0xb, 0xc, 0xd, 0xfe, 0xff},
.eraseblocks_expected = {{0x4, 0x2, TEST_ERASE_INJECTOR_2}, {0x0, 0x4, TEST_ERASE_INJECTOR_3},
{0xe, 0x2, TEST_ERASE_INJECTOR_2}},
.eraseblocks_expected_ind = 3,
.erase_test_name = "Erase protected region test case #0",
.write_test_name = "Write protected region test case #0",
}, {
/*
* Test case #1
*
* Initial vs written: all 16 bytes are different.
* Two layout regions each one 8 bytes, which is 1/2 size of chip.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, MOCK_CHIP_SIZE/2 - 1, "part1"}, {MOCK_CHIP_SIZE/2, MIN_REAL_CHIP_SIZE - 1, "part2"}},
.initial_buf = {0xf0, 0xf1, 0xf2, 0xf3, 0xf4, 0xf5, 0xf6, 0xf7,
0xf8, 0xf9, 0xfa, 0xfb, 0xfc, 0xfd, 0xfe, 0xff},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, 0xf6, 0xf7,
0xf8, 0xf9, 0xfa, 0xfb, 0xfc, 0xfd, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7,
0xa8, 0xa9, 0xaa, 0xab, 0xac, 0xad, 0xae, 0xaf},
.written_protected_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xf6, 0xf7,
0xf8, 0xf9, 0xfa, 0xfb, 0xfc, 0xfd, 0xae, 0xaf},
.eraseblocks_expected = {{0xe, 0x2, TEST_ERASE_INJECTOR_2}, {0x4, 0x2, TEST_ERASE_INJECTOR_2},
{0x0, 0x4, TEST_ERASE_INJECTOR_3}},
.eraseblocks_expected_ind = 3,
.erase_test_name = "Erase protected region test case #1",
.write_test_name = "Write protected region test case #1",
}, {
/*
* Test case #2
*
* Initial vs written: all 16 bytes are different.
* Three layout regions 8+4+4b
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, 7, "odd1"}, {8, 11, "odd2"}, {12, 15, "odd3"},
{MOCK_CHIP_SIZE, MIN_REAL_CHIP_SIZE - 1, "longtail"}},
.initial_buf = {0xff, 0xff, 0x0, 0xff, 0x0, 0xff, 0x0, 0xff,
0x0, 0xff, 0x0, 0xff, 0xff, 0xff, 0xff, 0xff},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, 0x0, 0xff,
0x0, 0xff, 0x0, 0xff, 0xff, 0xff, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7,
0xa8, 0xa9, 0xaa, 0xab, 0xac, 0xad, 0xae, 0xaf},
.written_protected_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0x0, 0xff,
0x0, 0xff, 0x0, 0xff, 0xff, 0xff, 0xae, 0xaf},
.eraseblocks_expected = {{0xe, 0x2, TEST_ERASE_INJECTOR_2}, {0x4, 0x2, TEST_ERASE_INJECTOR_2},
{0x0, 0x4, TEST_ERASE_INJECTOR_3}},
.eraseblocks_expected_ind = 3,
.erase_test_name = "Erase protected region test case #2",
.write_test_name = "Write protected region test case #2",
}, {
/*
* Test case #3
*
* Initial vs written: all 16 bytes are different.
* Layout with unaligned regions 2+4+9+1b which require use of the 1-byte erase block.
* Chip with eraseblocks 1, 2, 4, 8, 16.
*/
.chip = &chip_1_2_4_8_16,
.regions = {{0, 1, "reg2"}, {2, 5, "reg4"}, {6, 14, "reg9"},
{15, MIN_REAL_CHIP_SIZE - 1, "reg1"}},
.initial_buf = {0x4, 0x4, 0x5, 0x5, 0x5, 0x5, 0x6, 0x6,
0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x7},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, 0x6, 0x6,
0x6, 0x6, 0x6, 0x6, 0x6, 0x6, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7,
0xa8, 0xa9, 0xaa, 0xab, 0xac, 0xad, 0xae, 0xaf},
.written_protected_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0x6, 0x6,
0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0xae, 0xaf},
.eraseblocks_expected = {{0xf, 0x1, TEST_ERASE_INJECTOR_1}, {0xe, 0x1, TEST_ERASE_INJECTOR_1},
{0x2, 0x2, TEST_ERASE_INJECTOR_2}, {0x4, 0x2, TEST_ERASE_INJECTOR_2},
{0x0, 0x2, TEST_ERASE_INJECTOR_2}},
.eraseblocks_expected_ind = 5,
.erase_test_name = "Erase protected region test case #3",
.write_test_name = "Write protected region test case #3",
}, {
/*
* Test case #4
*
* Initial vs written: all 16 bytes are different.
* Layout with unaligned region 3+13b which require use of the 1-byte erase block.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, 2, "reg3"}, {3, MIN_REAL_CHIP_SIZE - 1, "tail"}},
.initial_buf = {0x4, 0x4, 0x4, 0x6, 0x6, 0x6, 0x6, 0x6,
0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, 0x6, 0x6,
0x6, 0x6, 0x6, 0x6, 0x6, 0x6, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7,
0xa8, 0xa9, 0xaa, 0xab, 0xac, 0xad, 0xae, 0xaf},
.written_protected_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0x6, 0x6,
0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0xae, 0xaf},
.eraseblocks_expected = {
{0x3, 0x1, TEST_ERASE_INJECTOR_1},
{0x4, 0x1, TEST_ERASE_INJECTOR_1},
{0x5, 0x1, TEST_ERASE_INJECTOR_1},
{0xe, 0x1, TEST_ERASE_INJECTOR_1},
{0xf, 0x1, TEST_ERASE_INJECTOR_1},
{0x0, 0x1, TEST_ERASE_INJECTOR_1},
{0x1, 0x1, TEST_ERASE_INJECTOR_1},
{0x2, 0x1, TEST_ERASE_INJECTOR_1},
},
.eraseblocks_expected_ind = 8,
.erase_test_name = "Erase protected region test case #4",
.write_test_name = "Write protected region test case #4",
}, {
/*
* Test case #5
*
* Initial vs written: all 16 bytes are different.
* Layout with unaligned region 9+7b.
* Chip with eraseblocks 1, 8, 16.
*/
.chip = &chip_1_8_16,
.regions = {{0, 8, "reg9"}, {9, MIN_REAL_CHIP_SIZE - 1, "tail"}},
.initial_buf = {0x4, 0x4, 0x4, 0x4, 0x4, 0x4, 0x4, 0x4,
0x4, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6, 0x6},
.erased_buf = {ERASE_VALUE, ERASE_VALUE, ERASE_VALUE, ERASE_VALUE,
ERASE_VALUE, ERASE_VALUE, 0x4, 0x4,
0x4, 0x6, 0x6, 0x6, 0x6, 0x6, ERASE_VALUE, ERASE_VALUE},
.written_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0xa6, 0xa7,
0xa8, 0xa9, 0xaa, 0xab, 0xac, 0xad, 0xae, 0xaf},
.written_protected_buf = {0xa0, 0xa1, 0xa2, 0xa3, 0xa4, 0xa5, 0x4, 0x4,
0x4, 0x6, 0x6, 0x6, 0x6, 0x6, 0xae, 0xaf},
.eraseblocks_expected = {
{0xe, 0x1, TEST_ERASE_INJECTOR_1},
{0xf, 0x1, TEST_ERASE_INJECTOR_1},
{0x0, 0x1, TEST_ERASE_INJECTOR_1},
{0x1, 0x1, TEST_ERASE_INJECTOR_1},
{0x2, 0x1, TEST_ERASE_INJECTOR_1},
{0x3, 0x1, TEST_ERASE_INJECTOR_1},
{0x4, 0x1, TEST_ERASE_INJECTOR_1},
{0x5, 0x1, TEST_ERASE_INJECTOR_1},
},
.eraseblocks_expected_ind = 8,
.erase_test_name = "Erase protected region test case #5",
.write_test_name = "Write protected region test case #5",
},
};
static int setup(void **state) {
struct test_case *current_test_case = *state;
g_state.current_test_case = current_test_case;
return 0;
}
static int teardown(void **state) {
return 0;
}
/*
* Creates the array of tests for each test case in test_cases[].
* Each test_case produces two tests: one for erase and one for write operation.
* The caller needs to free the allocated memory.
*/
struct CMUnitTest *get_erase_func_algo_tests(size_t *num_tests) {
const size_t test_cases_num = ARRAY_SIZE(test_cases);
// Twice the number of test cases, because each test case is run twice: for erase and write.
struct CMUnitTest *all_cases = calloc(test_cases_num * 2, sizeof(struct CMUnitTest));
*num_tests = test_cases_num * 2;
for (size_t i = 0; i < test_cases_num; i++) {
all_cases[i] = (struct CMUnitTest) {
.name = test_cases[i].erase_test_name,
.setup_func = setup,
.teardown_func = teardown,
.initial_state = &test_cases[i],
.test_func = erase_function_algo_test_success,
};
all_cases[i + test_cases_num] = (struct CMUnitTest) {
.name = test_cases[i].write_test_name,
.setup_func = setup,
.teardown_func = teardown,
.initial_state = &test_cases[i],
.test_func = write_function_algo_test_success,
};
}
return all_cases;
}
static void test_erase_fails_for_unwritable_region(void **);
static void test_write_with_sacrifice_ratio50(void **);
static void erase_unwritable_regions_skipflag_on_test_success(void **);
static void write_unwritable_regions_skipflag_on_test_success(void **);
static void test_erase_with_noverify(void **);
/*
* Creates the array of tests for each test case in test_cases_protected_region[].
* The caller needs to free the allocated memory.
*/
struct CMUnitTest *get_erase_protected_region_algo_tests(size_t *num_tests) {
const size_t num_parameterized = ARRAY_SIZE(test_cases_protected_region);
const size_t num_unparameterized = 3;
// Twice the number of parameterized test cases, because each test case is run twice:
// for erase and write.
const size_t num_cases = num_parameterized * 2 + num_unparameterized;
struct CMUnitTest *all_cases = calloc(num_cases, sizeof(struct CMUnitTest));
*num_tests = num_cases;
for (size_t i = 0; i < num_parameterized; i++) {
all_cases[i] = (struct CMUnitTest) {
.name = test_cases_protected_region[i].erase_test_name,
.setup_func = setup,
.teardown_func = teardown,
.initial_state = &test_cases_protected_region[i],
.test_func = erase_unwritable_regions_skipflag_on_test_success,
};
all_cases[i + num_parameterized] = (struct CMUnitTest) {
.name = test_cases_protected_region[i].write_test_name,
.setup_func = setup,
.teardown_func = teardown,
.initial_state = &test_cases_protected_region[i],
.test_func = write_unwritable_regions_skipflag_on_test_success,
};
}
memcpy(
&all_cases[num_parameterized * 2],
(const struct CMUnitTest[]){
(const struct CMUnitTest) {
.name = "erase failure for unskipped unwritable regions",
.test_func = test_erase_fails_for_unwritable_region,
},
(const struct CMUnitTest) {
.name = "write with sacrifice ratio 50",
.test_func = test_write_with_sacrifice_ratio50,
},
(const struct CMUnitTest) {
.name = "erase with noverify",
.test_func = test_erase_with_noverify,
},
},
sizeof(*all_cases) * num_unparameterized
);
return all_cases;
}
/*
* This function is invoked for every test case in test_cases[],
* current test case is passed as an argument.
*/
void erase_function_algo_test_success(void **state)
{
struct test_case* current_test_case = *state;
int all_erase_tests_result = 0;
struct flashrom_flashctx flashctx = { 0 };
const char *param = ""; /* Default values for all params. */
struct flashrom_layout *layout;
const chipoff_t verify_end_boundary = setup_chip(&flashctx, &layout, param, current_test_case);
printf("%s started.\n", current_test_case->erase_test_name);
int ret = flashrom_flash_erase(&flashctx);
printf("%s returned %d.\n", current_test_case->erase_test_name, ret);
int chip_erased = !memcmp(g_state.buf, current_test_case->erased_buf, MOCK_CHIP_SIZE);
int eraseblocks_in_order = !memcmp(g_state.eraseblocks_actual,
current_test_case->eraseblocks_expected,
current_test_case->eraseblocks_expected_ind * sizeof(struct erase_invoke));
int eraseblocks_invocations = (g_state.eraseblocks_actual_ind ==
current_test_case->eraseblocks_expected_ind);
int chip_verified = 1;
for (unsigned int i = 0; i <= verify_end_boundary; i++)
if (g_state.was_modified[i] && !g_state.was_verified[i]) {
chip_verified = 0; /* byte was modified, but not verified after */
printf("Error: byte 0x%x, modified: %d, verified: %d\n", i, g_state.was_modified[i], g_state.was_verified[i]);
}
if (chip_erased)
printf("Erased chip memory state for %s is CORRECT\n",
current_test_case->erase_test_name);
else
printf("Erased chip memory state for %s is WRONG\n",
current_test_case->erase_test_name);
if (eraseblocks_in_order)
printf("Eraseblocks order of invocation for %s is CORRECT\n",
current_test_case->erase_test_name);
else
printf("Eraseblocks order of invocation for %s is WRONG\n",
current_test_case->erase_test_name);
if (eraseblocks_invocations)
printf("Eraseblocks number of invocations for %s is CORRECT\n",
current_test_case->erase_test_name);
else
printf("Eraseblocks number of invocations for %s is WRONG, expected %d actual %d\n",
current_test_case->erase_test_name,
current_test_case->eraseblocks_expected_ind,
g_state.eraseblocks_actual_ind);
if (chip_verified)
printf("Erased chip memory state for %s was verified successfully\n",
current_test_case->erase_test_name);
else
printf("Erased chip memory state for %s was NOT verified completely\n",
current_test_case->erase_test_name);
all_erase_tests_result |= ret;
all_erase_tests_result |= !chip_erased;
all_erase_tests_result |= !eraseblocks_in_order;
all_erase_tests_result |= !eraseblocks_invocations;
all_erase_tests_result |= !chip_verified;
teardown_chip(&layout);
assert_int_equal(0, all_erase_tests_result);
}
/*
* This function is invoked for every test case in test_cases[],
* current test case is passed as an argument.
*/
void write_function_algo_test_success(void **state)
{
struct test_case* current_test_case = *state;
int all_write_test_result = 0;
struct flashrom_flashctx flashctx = { 0 };
uint8_t newcontents[MIN_BUF_SIZE];
const char *param = ""; /* Default values for all params. */
struct flashrom_layout *layout;
const chipoff_t verify_end_boundary = setup_chip(&flashctx, &layout, param, current_test_case);
memcpy(&newcontents, current_test_case->written_buf, MOCK_CHIP_SIZE);
printf("%s started.\n", current_test_case->write_test_name);
int ret = flashrom_image_write(&flashctx, &newcontents, MIN_BUF_SIZE, NULL);
printf("%s returned %d.\n", current_test_case->write_test_name, ret);
int chip_written = !memcmp(g_state.buf, current_test_case->written_buf, MOCK_CHIP_SIZE);
int eraseblocks_in_order = !memcmp(g_state.eraseblocks_actual,
current_test_case->write_eraseblocks_expected,
current_test_case->write_eraseblocks_expected_ind * sizeof(struct erase_invoke));
int eraseblocks_invocations = (g_state.eraseblocks_actual_ind ==
current_test_case->write_eraseblocks_expected_ind);
int chip_verified = 1;
for (unsigned int i = 0; i <= verify_end_boundary; i++)
if (g_state.was_modified[i] && !g_state.was_verified[i]) {
chip_verified = 0; /* the byte was modified, but not verified after */
printf("Error: byte 0x%x, modified: %d, verified: %d\n", i, g_state.was_modified[i], g_state.was_verified[i]);
}
if (chip_written)
printf("Written chip memory state for %s is CORRECT\n",
current_test_case->write_test_name);
else
printf("Written chip memory state for %s is WRONG\n",
current_test_case->write_test_name);
if (eraseblocks_in_order)
printf("Eraseblocks order of invocation for %s is CORRECT\n",
current_test_case->write_test_name);
else
printf("Eraseblocks order of invocation for %s is WRONG\n",
current_test_case->write_test_name);
if (eraseblocks_invocations)
printf("Eraseblocks number of invocations for %s is CORRECT\n",
current_test_case->write_test_name);
else
printf("Eraseblocks number of invocations for %s is WRONG, expected %d actual %d\n",
current_test_case->write_test_name,
current_test_case->write_eraseblocks_expected_ind,
g_state.eraseblocks_actual_ind);
if (chip_verified)
printf("Written chip memory state for %s was verified successfully\n",
current_test_case->write_test_name);
else
printf("Written chip memory state for %s was NOT verified completely\n",
current_test_case->write_test_name);
all_write_test_result |= ret;
all_write_test_result |= !chip_written;
all_write_test_result |= !eraseblocks_in_order;
all_write_test_result |= !eraseblocks_invocations;
all_write_test_result |= !chip_verified;
teardown_chip(&layout);
assert_int_equal(0, all_write_test_result);
}
static void get_protected_region(const struct flashctx *flash, unsigned int addr, struct flash_region *region)
{
if (addr < 20)
printf("Inside test get_protected_region for addr=0x%x\n", addr);
if (addr < START_PROTECTED_REGION) {
region->name = strdup("not protected");
region->start = 0;
region->end = START_PROTECTED_REGION - 1;
region->read_prot = false;
region->write_prot = false;
} else if (addr <= END_PROTECTED_REGION) {
region->name = strdup("protected");
region->start = START_PROTECTED_REGION;
region->end = END_PROTECTED_REGION;
region->read_prot = false;
region->write_prot = true;
} else {
region->name = strdup("tail");
region->start = END_PROTECTED_REGION + 1;
region->end = flashrom_flash_getsize(flash) - 1;
region->read_prot = false;
region->write_prot = false;
}
}
static int block_erase_chip_with_protected_region(struct flashctx *flash, enum block_erase_func erase_func, unsigned int blockaddr, unsigned int blocklen)
{
if (blockaddr + blocklen <= MOCK_CHIP_SIZE) {
LOG_ERASE_FUNC;
/* Register eraseblock invocation. */
g_state.eraseblocks_actual[g_state.eraseblocks_actual_ind] = (struct erase_invoke){
.erase_func = erase_func,
.blocklen = blocklen,
.blockaddr = blockaddr,
};
g_state.eraseblocks_actual_ind++;
}
assert_in_range(blockaddr + blocklen, 0, MIN_REAL_CHIP_SIZE);
// Check we are not trying to erase protected region. This should not happen,
// because the logic should handle protected regions and never invoke erasefn
// for them. If this happens, means there is a bug in erasure logic, and test fails.
//
// Note: returning 1 instead of assert, so that the flow goes back to erasure code
// to clean up the memory after failed erase. Memory leaks are also tested by unit tests.
const unsigned int erase_op_size = 1 << (erase_func - TEST_ERASE_INJECTOR_1);
if (blocklen < erase_op_size) {
printf("Error: block length %d is smaller than erase_func length %d\n", blocklen, erase_op_size);
return 1;
}
if ((blockaddr >= START_PROTECTED_REGION && blockaddr <= END_PROTECTED_REGION)
|| (blockaddr + blocklen - 1 >= START_PROTECTED_REGION
&& blockaddr + blocklen - 1 <= END_PROTECTED_REGION)
|| (blockaddr < START_PROTECTED_REGION
&& blockaddr + blocklen + 1 > END_PROTECTED_REGION)) {
printf("Error: block with start=%d, len=%d overlaps protected region %d-%d\n",
blockaddr, blocklen, START_PROTECTED_REGION, END_PROTECTED_REGION);
return 1;
}
memset(&g_state.buf[blockaddr], ERASE_VALUE, blocklen);
/* Track the bytes were erased */
memset(&g_state.was_modified[blockaddr], true, blocklen);
/* Clear the records of previous verification, if there were any */
memset(&g_state.was_verified[blockaddr], false, blocklen);
return 0;
}
#define BLOCK_ERASE_PROTECTED_FUNC(i) static int block_erase_chip_with_protected_region_ ## i \
(struct flashctx *flash, unsigned int blockaddr, unsigned int blocklen) { \
return block_erase_chip_with_protected_region(flash, TEST_ERASE_INJECTOR_ ## i, blockaddr, blocklen); \
}
BLOCK_ERASE_PROTECTED_FUNC(1)
BLOCK_ERASE_PROTECTED_FUNC(2)
BLOCK_ERASE_PROTECTED_FUNC(3)
BLOCK_ERASE_PROTECTED_FUNC(4)
BLOCK_ERASE_PROTECTED_FUNC(5)
/*
* Runs the test cases that use protected flash regions (regions returned from
* get_flash_region() where write_prot is true) when the runtime flag to avoid
* writing to those regions is enabled.
*
* These tests verify that no protected region is erased, and that the erase
* commands used match the expected erase size (ensuring for example that a
* command erasing 16 bytes is not used when only 8 should be erased).
*/
static void erase_unwritable_regions_skipflag_on_test_success(void **state)
{
struct test_case* current_test_case = *state;
int all_erase_tests_result = 0;
struct flashrom_flashctx flashctx = { 0 };
const char *param = ""; /* Default values for all params. */
struct flashrom_layout *layout;
const chipoff_t verify_end_boundary = setup_chip(&flashctx, &layout, param, current_test_case);
// This test needs special block erase to emulate protected regions.
memcpy(g_test_erase_injector,
(erasefunc_t *const[]){
block_erase_chip_with_protected_region_1,
block_erase_chip_with_protected_region_2,
block_erase_chip_with_protected_region_3,
block_erase_chip_with_protected_region_4,
block_erase_chip_with_protected_region_5,
},
sizeof(g_test_erase_injector)
);
flashrom_flag_set(&flashctx, FLASHROM_FLAG_SKIP_UNWRITABLE_REGIONS, true);
// We use dummyflasher programmer in tests, but for this test we need to
// replace dummyflasher's default get_region fn with test one.
// The rest of master struct is fine for this test.
// Note dummyflasher registers multiple masters by default, so replace
// get_region for each of them.
flashctx.mst->spi.get_region = &get_protected_region;
flashctx.mst->opaque.get_region = &get_protected_region;
printf("%s started.\n", current_test_case->erase_test_name);
int ret = flashrom_flash_erase(&flashctx);
printf("%s returned %d.\n", current_test_case->erase_test_name, ret);
int chip_erased = !memcmp(g_state.buf, current_test_case->erased_buf, MOCK_CHIP_SIZE);
int eraseblocks_in_order = !memcmp(g_state.eraseblocks_actual,
current_test_case->eraseblocks_expected,
current_test_case->eraseblocks_expected_ind * sizeof(struct erase_invoke));
int eraseblocks_invocations = (g_state.eraseblocks_actual_ind ==
current_test_case->eraseblocks_expected_ind);
int chip_verified = 1;
for (unsigned int i = 0; i <= verify_end_boundary; i++)
if (g_state.was_modified[i] && !g_state.was_verified[i]) {
chip_verified = 0; /* byte was modified, but not verified after */
printf("Error: byte 0x%x, modified: %d, verified: %d\n", i, g_state.was_modified[i], g_state.was_verified[i]);
}
if (chip_erased)
printf("Erased chip memory state for %s is CORRECT\n",
current_test_case->erase_test_name);
else
printf("Erased chip memory state for %s is WRONG\n",
current_test_case->erase_test_name);
if (eraseblocks_in_order)
printf("Eraseblocks order of invocation for %s is CORRECT\n",
current_test_case->erase_test_name);
else
printf("Eraseblocks order of invocation for %s is WRONG\n",
current_test_case->erase_test_name);
if (eraseblocks_invocations)
printf("Eraseblocks number of invocations for %s is CORRECT\n",
current_test_case->erase_test_name);
else
printf("Eraseblocks number of invocations for %s is WRONG, expected %d actual %d\n",
current_test_case->erase_test_name,
current_test_case->eraseblocks_expected_ind,
g_state.eraseblocks_actual_ind);
if (chip_verified)
printf("Erased chip memory state for %s was verified successfully\n",
current_test_case->erase_test_name);
else
printf("Erased chip memory state for %s was NOT verified completely\n",
current_test_case->erase_test_name);
all_erase_tests_result |= ret;
all_erase_tests_result |= !chip_erased;
all_erase_tests_result |= !eraseblocks_in_order;
all_erase_tests_result |= !eraseblocks_invocations;
all_erase_tests_result |= !chip_verified;
teardown_chip(&layout);
assert_int_equal(0, all_erase_tests_result);
}
/*
* Runs the test cases that use protected flash regions (regions returned from
* get_flash_region() where write_prot is true) when the runtime flag to avoid
* writing to those regions is enabled.
*
* These tests verify that no protected region is written, i.e. protected region
* memory state stays untouched.
*/
static void write_unwritable_regions_skipflag_on_test_success(void **state) {
struct test_case* current_test_case = *state;
int all_write_tests_result = 0;
struct flashrom_flashctx flashctx = { 0 };
uint8_t newcontents[MIN_BUF_SIZE];
uint8_t newcontents_protected[MIN_BUF_SIZE];
const char *param = ""; /* Default values for all params. */
struct flashrom_layout *layout;
const chipoff_t verify_end_boundary = setup_chip(&flashctx, &layout, param, current_test_case);
memcpy(&newcontents, current_test_case->written_buf, MOCK_CHIP_SIZE);
// This test needs special block erase to emulate protected regions.
memcpy(g_test_erase_injector,
(erasefunc_t *const[]){
block_erase_chip_with_protected_region_1,
block_erase_chip_with_protected_region_2,
block_erase_chip_with_protected_region_3,
block_erase_chip_with_protected_region_4,
block_erase_chip_with_protected_region_5,
},
sizeof(g_test_erase_injector)
);
flashrom_flag_set(&flashctx, FLASHROM_FLAG_SKIP_UNWRITABLE_REGIONS, true);
flashrom_flag_set(&flashctx, FLASHROM_FLAG_SKIP_UNREADABLE_REGIONS, true);
flashrom_flag_set(&flashctx, FLASHROM_FLAG_VERIFY_WHOLE_CHIP, false);
/* We need to manually trigger verify op after write, because of protected regions */
flashrom_flag_set(&flashctx, FLASHROM_FLAG_VERIFY_AFTER_WRITE, false);
// We use dummyflasher programmer in tests, but for this test we need to
// replace dummyflasher's default get_region fn with test one.
// The rest of master struct is fine for this test.
// Note dummyflasher registers multiple masters by default, so replace
// get_region for each of them.
flashctx.mst->spi.get_region = &get_protected_region;
flashctx.mst->opaque.get_region = &get_protected_region;
printf("%s started.\n", current_test_case->write_test_name);
int ret = flashrom_image_write(&flashctx, &newcontents, MIN_BUF_SIZE, NULL);
printf("%s returned %d.\n", current_test_case->write_test_name, ret);
/* Expected end result leaves protected region untouched */
memcpy(&newcontents_protected, current_test_case->written_protected_buf, MOCK_CHIP_SIZE);
/* Outside of MOCK_CHIP_SIZE newcontents are not initialised in test cases, so just copy */
memcpy(&newcontents_protected[MOCK_CHIP_SIZE],
&newcontents[MOCK_CHIP_SIZE],
MIN_BUF_SIZE - MOCK_CHIP_SIZE);
printf("%s verification started.\n", current_test_case->write_test_name);
ret = flashrom_image_verify(&flashctx, &newcontents_protected, MIN_BUF_SIZE);
printf("%s verification returned %d.\n", current_test_case->write_test_name, ret);
int chip_written = !memcmp(g_state.buf, current_test_case->written_protected_buf, MOCK_CHIP_SIZE);
int chip_verified = 1;
for (unsigned int i = 0; i <= verify_end_boundary; i++)
if (g_state.was_modified[i] && !g_state.was_verified[i]) {
chip_verified = 0; /* byte was modified, but not verified after */
printf("Error: byte 0x%x, modified: %d, verified: %d\n", i, g_state.was_modified[i], g_state.was_verified[i]);
}
if (chip_written)
printf("Written chip memory state for %s is CORRECT\n",
current_test_case->write_test_name);
else
printf("Written chip memory state for %s is WRONG\n",
current_test_case->write_test_name);
if (chip_verified)
printf("Written chip memory state for %s was verified successfully\n",
current_test_case->write_test_name);
else
printf("Written chip memory state for %s was NOT verified completely\n",
current_test_case->write_test_name);
all_write_tests_result |= ret;
all_write_tests_result |= !chip_written;
all_write_tests_result |= !chip_verified;
teardown_chip(&layout);
assert_int_equal(0, all_write_tests_result);
}
static void test_erase_fails_for_unwritable_region(void **state) {
struct flashrom_flashctx flashctx = {
.chip = &chip_1_2_4_8_16,
};
assert_int_equal(0, programmer_init(&programmer_dummy, ""));
flashctx.mst = &registered_masters[0];
flashctx.mst->spi.get_region = &get_protected_region;
flashctx.mst->opaque.get_region = &get_protected_region;
flashrom_flag_set(&flashctx, FLASHROM_FLAG_SKIP_UNWRITABLE_REGIONS, false);
/* Ask to erase one byte at the end of the unprotected region and one byte
* at the beginning of the protected one. If the check for unwritable regions
* wrongly treats the upper bound as exclusive, it will incorrectly try
* to erase inside the protected region. */
struct flashrom_layout *layout;
flashrom_layout_new(&layout);
flashrom_layout_add_region(layout, 7, 8, "protected");
flashrom_layout_include_region(layout, "protected");
flashrom_layout_set(&flashctx, layout);
int ret = flashrom_flash_erase(&flashctx);
assert_int_equal(0, programmer_shutdown());
flashrom_layout_release(layout);
assert_int_not_equal(ret, 0);
}
static void test_write_with_sacrifice_ratio50(void **state) {
struct test_case* current_test_case = &test_cases[20];
int all_write_test_result = 0;
struct flashrom_flashctx flashctx = {
/* If eraseblocks of smaller size fill in more than a half of the area,
* erase one larger size block instead. */
.sacrifice_ratio = 50,
};
/* Custom expectations because sacrifice ratio is modified (not default). */
struct erase_invoke eraseblocks_expected = {0x0, 0x10, TEST_ERASE_INJECTOR_5};
unsigned int eraseblocks_expected_ind = 1;
uint8_t newcontents[MIN_BUF_SIZE];
const char *param = ""; /* Default values for all params. */
struct flashrom_layout *layout;
const chipoff_t verify_end_boundary = setup_chip(&flashctx, &layout, param, current_test_case);
memcpy(&newcontents, current_test_case->written_buf, MOCK_CHIP_SIZE);
printf("%s started.\n", __func__);
int ret = flashrom_image_write(&flashctx, &newcontents, MIN_BUF_SIZE, NULL);
printf("%s returned %d.\n", __func__, ret);
int chip_written = !memcmp(g_state.buf, current_test_case->written_buf, MOCK_CHIP_SIZE);
int eraseblocks_in_order = !memcmp(g_state.eraseblocks_actual, &eraseblocks_expected,
eraseblocks_expected_ind * sizeof(struct erase_invoke));
int eraseblocks_invocations = (g_state.eraseblocks_actual_ind == eraseblocks_expected_ind);
int chip_verified = 1;
for (unsigned int i = 0; i <= verify_end_boundary; i++)
if (g_state.was_modified[i] && !g_state.was_verified[i]) {
chip_verified = 0; /* the byte was modified, but not verified after */
printf("Error: byte 0x%x, modified: %d, verified: %d\n", i, g_state.was_modified[i], g_state.was_verified[i]);
}
if (chip_written)
printf("Written chip memory state for %s is CORRECT\n", __func__);
else
printf("Written chip memory state for %s is WRONG\n", __func__);
if (eraseblocks_in_order)
printf("Eraseblocks order of invocation for %s is CORRECT\n", __func__);
else
printf("Eraseblocks order of invocation for %s is WRONG\n", __func__);
if (eraseblocks_invocations)
printf("Eraseblocks number of invocations for %s is CORRECT\n", __func__);
else
printf("Eraseblocks number of invocations for %s is WRONG, expected %d actual %d\n",
__func__,
eraseblocks_expected_ind,
g_state.eraseblocks_actual_ind);
if (chip_verified)
printf("Written chip memory state for %s was verified successfully\n", __func__);
else
printf("Written chip memory state for %s was NOT verified completely\n", __func__);
all_write_test_result |= ret;
all_write_test_result |= !chip_written;
all_write_test_result |= !eraseblocks_in_order;
all_write_test_result |= !eraseblocks_invocations;
all_write_test_result |= !chip_verified;
teardown_chip(&layout);
assert_int_equal(0, all_write_test_result);
}
static void test_erase_with_noverify(void **state)
{
/* The exact test case doesn't matter that much, because we only want to test
* that verification was NOT invoked. */
struct test_case* current_test_case = &test_cases[2];
int all_erase_tests_result = 0;
struct flashrom_flashctx flashctx = { 0 };
const char *param = ""; /* Default values for all params. */
struct flashrom_layout *layout;
const chipoff_t verify_end_boundary = setup_chip(&flashctx, &layout, param, current_test_case);
/* We want to test that verify NOT performed. */
flashrom_flag_set(&flashctx, FLASHROM_FLAG_VERIFY_AFTER_WRITE, false);
printf("%s started.\n", current_test_case->erase_test_name);
int ret = flashrom_flash_erase(&flashctx);
printf("%s returned %d.\n", current_test_case->erase_test_name, ret);
int chip_erased = !memcmp(g_state.buf, current_test_case->erased_buf, MOCK_CHIP_SIZE);
int eraseblocks_in_order = !memcmp(g_state.eraseblocks_actual,
current_test_case->eraseblocks_expected,
current_test_case->eraseblocks_expected_ind * sizeof(struct erase_invoke));
int eraseblocks_invocations = (g_state.eraseblocks_actual_ind ==
current_test_case->eraseblocks_expected_ind);
int chip_verified = 0;
for (unsigned int i = 0; i <= verify_end_boundary; i++)
if (g_state.was_modified[i] && g_state.was_verified[i]) {
chip_verified = 1; /* byte was verified, but we disabled verification! */
printf("Error: byte 0x%x was verified, but verification is disabled\n", i);
}
if (chip_erased)
printf("Erased chip memory state for %s is CORRECT\n",
current_test_case->erase_test_name);
else
printf("Erased chip memory state for %s is WRONG\n",
current_test_case->erase_test_name);
if (eraseblocks_in_order)
printf("Eraseblocks order of invocation for %s is CORRECT\n",
current_test_case->erase_test_name);
else
printf("Eraseblocks order of invocation for %s is WRONG\n",
current_test_case->erase_test_name);
if (eraseblocks_invocations)
printf("Eraseblocks number of invocations for %s is CORRECT\n",
current_test_case->erase_test_name);
else
printf("Eraseblocks number of invocations for %s is WRONG, expected %d actual %d\n",
current_test_case->erase_test_name,
current_test_case->eraseblocks_expected_ind,
g_state.eraseblocks_actual_ind);
if (!chip_verified)
printf("Verification was not performed, as it was disabled.\n");
else
printf("ERROR: verify operation was disabled, but it was performed.\n");
all_erase_tests_result |= ret;
all_erase_tests_result |= !chip_erased;
all_erase_tests_result |= !eraseblocks_in_order;
all_erase_tests_result |= !eraseblocks_invocations;
all_erase_tests_result |= chip_verified;
teardown_chip(&layout);
assert_int_equal(0, all_erase_tests_result);
}
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